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Applied Physics Letters

Volumn 94, Issue 7, 2009, Pages

In situ detection of porosity initiation during aluminum thin film anodizing

(3) Van Overmeere, Quentin a Nysten, Bernard a Proost, Joris a

a UNIVERSITÉ CATHOLIQUE DE LOUVAIN (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM; OPTICAL FILMS; SULFURIC ACID; THIN FILM DEVICES; THIN FILMS;

ALUMINUM THIN FILMS; CURVATURE MEASUREMENTS; DENSITY DISTRIBUTIONS; EX-SITU ATOMIC FORCE MICROSCOPIES; HIGH RESOLUTIONS; IN-SITU; INTERNAL STRESS; QUANTITATIVE ANALYSIS; REAL-TIME DETECTIONS;

POROSITY;

EID: 60749100133 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3081014 Document Type: Article

Times cited : (27)

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