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Volumn , Issue , 2011, Pages 135-144

Stochastic computing: Embracing errors in architecture and design of processors and applications

Author keywords

Error resilience; Stochastic computing

Indexed keywords

CIRCUIT DENSITY; COMPUTING TECHNIQUES; DEVICE SIZES; DRIVING FORCES; DYNAMIC CIRCUITS; ENERGY BENEFITS; ERROR RESILIENCE; HARDWARE ERROR; MANUFACTURING CHALLENGES; MARGINAL BENEFIT; MOORE'S LAW; NON-DETERMINISM; SEMICONDUCTOR SCALING; STATIC AND DYNAMIC; STOCHASTIC COMPUTING; TECHNOLOGY SCALING;

EID: 81255207081     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2038698.2038720     Document Type: Conference Paper
Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.