Persistent misconceptions about incoherence in electron microscopy

Ultramicroscopy

Volumn 111, Issue 7, 2011, Pages 894-900

  Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

HAADF STEM; HREM; Incoherence

Indexed keywords

DIFFUSE SCATTERING; ELASTIC CONTRAST; HAADF-STEM; INCOHERENCE; LIGHT ATOMS; MEAN SQUARE DISPLACEMENT; MICROSCOPIC IMAGING; SOFT MATTER; STOBBS FACTOR;

ATOMS; COMPUTER SIMULATION; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSCOPIC EXAMINATION;

COHERENT SCATTERING;

ARTICLE; CONTROLLED STUDY; CRYSTAL STRUCTURE; ELASTICITY; ELECTRON DIFFRACTION; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE QUALITY; IMAGE RECONSTRUCTION; LIGHT SCATTERING; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; PHASE CONTRAST MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL DETECTION; THERMAL DIFFUSION; TRANSMISSION ELECTRON MICROSCOPY;

COMPUTER SIMULATION; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; MICROSCOPY, PHASE-CONTRAST;

EID: 80053051586     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.007     Document Type: Article

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