Analytical description of the motion of an acoustic-driven atomic force microscope cantilever in liquid

Applied Physics Letters

Volumn 90, Issue 11, 2007, Pages

  Jai, Ćdric ^a   Cohen Bouhacina, Touria ^a   Maali, Abdelhamid ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; Q FACTOR MEASUREMENT; STIFFNESS;

CANTILEVER DEFLECTION; DEFLECTION MOTION; QUALITY FACTORS;

SEMICONDUCTING LIQUIDS;

EID: 33947306093     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2713860     Document Type: Article

References (17)

1. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. J. F. Giessibl, Science 267, 68 (1995).
3. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
4. D. Anselmetti, R. Lüthi, E. Meyer, T. Richmond, M. Dreier, J. E. Frommer, and H.-J. Güntherodt, Nanotechnology 5, 87 (1994).
5. Q. Zhong, D. Imniss, K. Kjoller, and V. B. Elings, Surf. Sci. 290, L688 (1993).
6. J. Tamayo and R. García, Langmuir 12, 4430 (1996).
7. K. Sasaki, Y. Koike, H. Azehara, H. Horaki, and M. Fujihira, Appl. Phys. A: Mater. Sci. Process. 66, 1275 (1998).
8. G. Bar, Y. Thomann, and M.-H. Whangbo, Langmuir 14, 1219 (1998).
9. G. Meyer and N. M. Amer, Appl. Phys. Lett. 53, 1045 (1988).
10. S. Alexander, L. Hellemans, O. Marti, J. Schneir, V. Elings, P. K. Hansma, M. Longmire, and J. Gurley, J. Appl. Phys. 65, 164 (1989).
11. J. Tamayo and R. García, Appl. Phys. Lett. 73, 2926 (1998).
12. J. P. Cleveland, B. Anczykowski, E. Schmid, and V. Elings, Appl. Phys. Lett. 72, 2613 (1998).
13. J. P. Aime, R. Boisgard, L. Nony, and G. Couturier, J. Phys. Chem. 114, 4945 (2001).
14. A. San Paulo and R. García, Phys. Rev. B 64, 193411 (2001).
15. M. Lantz, Y. Z. Liu, X. D. Cui, H. Tokumoto, and S. M. Lindsay, Surf. Interface Anal. 27, 354 (1999).
16. K. Yagasaki, Phys. Rev. B 70, 245419 (2004).
17. A. Maali, C. Hurth, T. Cohen-Bouhacina, G. Couturier, and J.-P. Aiḿ, Appl. Phys. Lett. 88, 163504 (2006).