Simultaneous measurements of conductivity and magnetism by using microprobes and electron holography

Applied Physics Letters

Volumn 88, Issue 22, 2006, Pages

  Murakami, Y ^a   Kawamoto, N ^a   Shindo, D ^a   Ishikawa, I ^b   Deguchi, S ^b   Yamazaki, K ^b   Inoue, M ^b   Kondo, Y ^b   Suganuma, K ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; MAGNETIC FLUX; MAGNETIC MATERIALS; MAGNETISM; RESEARCH AND DEVELOPMENT MANAGEMENT; TRANSMISSION ELECTRON MICROSCOPY;

DOUBLE-PROBE PIEZODRIVING HOLDER; MICROPROBES; THIN FOIL;

ELECTRIC CONDUCTIVITY;

EID: 33744827089     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2208384     Document Type: Article

References (16)

1. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994).
2. Y. Tokura, A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, A. Kido, and H. Furukawa, J. Phys. Soc. Jpn. 63, 3931 (1994).
3. A. Moreo, S. Yunoki, and E. Dagotto, Science 283, 2034 (1999).
4. M. Fäth, S. Freisem, A. A. Menovsky, Y. Tomioka, J. Aarts, and J. A. Mydosh, Science 285, 1540 (1999).
5. M. Uehara, S. Mori, C. H. Chen, and S.-W. Cheong, Nature (London) 399, 560 (1999).
6. Y. Murakami, J. H. Yoo, D. Shindo, T. Atou, and M. Kikuchi, Nature (London) 423, 6943 (2003).
7. J. H. Yoo, Y. Murakami, D. Shindo, T. Atou, and M. Kikuchi, Phys. Rev. Lett. 93, 047204 (2004).
8. H. Ohnishi, Y. Kondo, and K. Takayanagi, Nature (London) 395, 780 (1998).
9. Y. Kondo and K. Takayanagi, Science 289, 606 (2000).
10. T. Kizuka, K. Yamada, S. Deguchi, M. Naruse, and N. Tanaka, Phys. Rev. B 55, R7398 (1997).
11. K. Ziegler, D. M. Lyons, J. D. Holmes, D. Erts, B. Polyakov, H. Olin, K. Svensson, and E. Olsson, Appl. Phys. Lett. 84, 4074 (2004).
12. M. Wang, J. Wang, Q. Chen, and L.-M. Peng, Adv. Funct. Mater. 15, 1825 (2005).
13. M. Yamashita and K. Suganuma, J. Electron. Mater. 31, 551 (2002).
14. N. Kawamoto, Y. Murakami, D. Shindo, K. S. Kim, and K. Suganuma, J. Jpn. Inst. Met. 70, 384 (2006) [in Japanese].
15. D. Shindo and T. Oikawa, Analytical Electron Microscopy for Materials Science (Springer, Tokyo, 2002).
16. A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, G. Kido, and Y. Tokura, Phys. Rev. B 51, 14103 (1995).