Modifications in structural and electronic properties of TiO2 thin films using swift heavy ion irradiation

Journal of Applied Physics

Volumn 110, Issue 8, 2011, Pages

  Thakur, Hardeep ^a   Kumar, Ravi ^a   Thakur, P ^b   Brookes, N B ^b   Sharma, K K ^a   Pratap Singh, Abhinav ^c   Kumar, Yogesh ^c   Gautam, S ^d   Chae, K H ^d  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^d Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; FLUENCES; HIGH RESOLUTION X RAY DIFFRACTION; O K-EDGES; ORBITALS; RADIO FREQUENCY MAGNETRON SPUTTERING; RAMAN MEASUREMENTS; RUTILE PHASIS; SAPPHIRE SUBSTRATES; SHI IRRADIATION; SPECTRAL FEATURE; STRUCTURAL DISORDERS; STRUCTURAL PHASE TRANSITION; SWIFT HEAVY ION IRRADIATION; SWIFT HEAVY IONS; TIO;

ABSORPTION; ELECTRONIC STRUCTURE; HEAVY IONS; IRRADIATION; OXIDE MINERALS; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

ELECTRONIC PROPERTIES;

EID: 80655132104     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3657466     Document Type: Article

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