Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM

IBM Journal of Research and Development

Volumn 55, Issue 4, 2011, Pages

  Christensen, S L ^a   Haines, B M ^a   Lanke, U D ^a,b   Paige, M F ^a   Urquhart, S G ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b CANADIAN LIGHT SOURCE INC   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE CONTRASTS; NARROW ENERGY BANDS; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORGANIC SURFACES; QUANTITATIVE CHEMICAL ANALYSIS; RADIATION EXPOSURE; SPATIALLY RESOLVED; SPECTROMICROSCOPY; WORK-FUNCTION DIFFERENCE; X-RAY PHOTOEMISSIONS;

BAND STRUCTURE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

CHEMICAL DETECTION;

EID: 80655123004     PISSN: 00188646     EISSN: 21518556     Source Type: Journal    
DOI: 10.1147/JRD.2011.2143550     Document Type: Conference Paper

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