Structural and compositional mapping of a phase-separated Langmuir-Blodgett monolayer by X-ray photoelectron emission microscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 162, Issue 3, 2008, Pages 107-114

  Christensen, Stephen ^a   Lanke, Uday D ^a   Haines, Brian ^a   Qaqish, Shatha E ^a   Paige, Matthew F ^a   Urquhart, Stephen G ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

Atomic force microscopy; Compositional mapping; Monolayer film; Secondary electron emission microscopy; X ray photoemission microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; LANGMUIR BLODGETT FILMS; MOLECULAR STRUCTURE; PHASE COMPOSITION; SECONDARY EMISSION; X RAY PHOTOELECTRON SPECTROSCOPY;

COMPOSITIONAL MAPPING; FILM TOPOGRAPHY; MONOLAYER FILMS; SECONDARY ELECTRON EMISSION MICROSCOPY;

MONOLAYERS;

EID: 40649104299     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2007.12.003     Document Type: Article

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