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Volumn 8168, Issue , 2011, Pages

Exclusive examples of high-performance thin-film optical filters for fluorescence spectroscopy made by plasma-assisted reactive magnetron sputtering

Author keywords

Magnetron sputtering; Optical broadband monitoring; Thin film optical filters

Indexed keywords

BAND PASS; COATING DESIGNS; COATING TECHNOLOGIES; DESIGN SOFTWARES; FILM STRESS; FLUORESCENCE MICROSCOPES; MEASUREMENT RESULTS; METAL OXIDES; MICRO-ROUGHNESS; OPTICAL BROADBAND MONITORING; REACTIVE MAGNETRON SPUTTERING; RESEARCH AND DEVELOPMENT; SHORTWAVE PASS FILTER; SPECTRAL CHARACTERISTICS; THIN FILM OPTICAL FILTERS; THIN FILM OPTICS; TOTAL INTEGRATED SCATTERINGS;

EID: 80455174321     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.896846     Document Type: Conference Paper
Times cited : (5)

References (11)
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  • 3
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    • COL 8
    • Jakobs, S., Lappschies, M., Schallenberg, U., Stenzel, O., Wilbrandt, S., "Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering", Chinese optics letters : COL 8, no.s1, p.73- 77 (2010).
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  • 6
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    • Groß, T., Lappschies, M., Starke, K., Ristau, D., "Systematic errors in broadband optical monitoring, " in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America), paper ME4 (2001).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.