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Volumn 7101, Issue , 2008, Pages

High performance notch filter coatings produced with PIAD and magnetron sputtering

Author keywords

Equivalent layer; Magnetron sputtering; Notch filter; PIAD

Indexed keywords

COATINGS; EPITAXIAL GROWTH; MAGNETRON SPUTTERING; MAGNETRONS; OPTICAL FILTERS; OPTICAL PROPERTIES; PLATING; REFRACTIVE INDEX; SIGNAL INTERFERENCE; THICK FILMS; THIN FILMS; WAVE FILTERS;

EID: 56249101755     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.797699     Document Type: Conference Paper
Times cited : (26)

References (7)
  • 1
    • 0000034266 scopus 로고
    • Equivalent layers in multilayer filters
    • A. Thelen, "Equivalent layers in multilayer filters", J. Opt. Soc. Am. 56, 1533-1538 (1966).
    • (1966) J. Opt. Soc. Am , vol.56 , pp. 1533-1538
    • Thelen, A.1
  • 2
    • 0003415938 scopus 로고    scopus 로고
    • Third Edition, Institute of Physics Publishing, Bristol and Philadelphia
    • A. Macleod, "Thin-film optical filters", Third Edition, Institute of Physics Publishing, Bristol and Philadelphia (2001).
    • (2001) Thin-film optical filters
    • Macleod, A.1
  • 3
    • 84899005211 scopus 로고    scopus 로고
    • Plasma ion assisted deposition: A powerful technology for the production of optical coatings
    • A. Zoeller, R. Goetzelmann, W. Klug, K. Matl, "Plasma ion assisted deposition: a powerful technology for the production of optical coatings", SPIE, Vol. 3133-23, 1997
    • (1997) SPIE , vol.3133 -23
    • Zoeller, A.1    Goetzelmann, R.2    Klug, W.3    Matl, K.4
  • 4
    • 0034542571 scopus 로고    scopus 로고
    • Rapid Prototyping of Optical Thin Film Filters
    • K. Starke, T. Gross, M. Lappschies, D. Ristau, "Rapid Prototyping of Optical Thin Film Filters", SPIE, Vol. 4094, 83, 2000
    • (2000) SPIE , vol.4094 , pp. 83
    • Starke, K.1    Gross, T.2    Lappschies, M.3    Ristau, D.4
  • 7
    • 56249087490 scopus 로고    scopus 로고
    • A. Zoeller, M. Boos, R. Goetzelmann, H. Hagedorn, W. Klug, Substantial progress in optical monitoring intermittent measurement technique, OSD, 5963-13, Jena 2005
    • A. Zoeller, M. Boos, R. Goetzelmann, H. Hagedorn, W. Klug, "Substantial progress in optical monitoring intermittent measurement technique", OSD, Vol. 5963-13, Jena 2005


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.