Laser induced damage of pure and mixture material high reflectors for 355nm and 1064nm wavelength

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8168, Issue , 2011, Pages

  Mende, Mathias ^a   Jensen, Lars O ^a   Ehlers, Henrik ^a   Riggers, Werner ^b   Blaschke, Holger ^c   Ristau, Detlev ^a,d  

^a LASER ZENTRUM HANNOVER E V   (Germany)

^b Laseroptik GmbH   (Germany)

^c JENOPTIK Laser Optik Systeme GmbH   (Germany)

^d LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

1064nm; 355nm; Hafnia mixtures; High reflecting multilayers; Laser induced damage

Indexed keywords

1064NM; 355NM; HAFNIA MIXTURES; HIGH REFLECTING MULTILAYERS; LASER-INDUCED DAMAGE;

ATOMIC SPECTROSCOPY; COATINGS; ELECTRON BEAMS; EVAPORATION; FILM PREPARATION; HAFNIUM OXIDES; HIGH POWER LASERS; LASER DAMAGE; MATERIALS HANDLING; MIXTURES; MULTILAYER FILMS; MULTILAYERS; NEODYMIUM LASERS; OPTICAL CONSTANTS; PHASE TRANSITIONS; PHOTOELECTRON SPECTROSCOPY; REFLECTION; REFRACTIVE INDEX; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

PULSED LASERS;

EID: 80455174267     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.897049     Document Type: Conference Paper

References (13)

1. 1-xcomposite thin films", Thin Solid Films 258(1-2), 91-103 (1995).
2. 2 composite films", Applied Optics 24(16), 2647-2650 (1985).
3. Jupé, M., Lappschies, M., Jensen, L., Starke, K. and Ristau, D., "Laser-induced damage in gradual index layers and Rugate filters", Proc. SPIE 6403, 640311 (2006).
4. Stolze, C. J., Thomas, M. D., Griffin, A. J., "BDS thin film damage competition", Proc. SPIE 7132, 71320C (2008).
5. Stenzel, O., Wilbrandt, S., Schürmann, M., Kaiser, N., Ehlers, H., Mende, M., Ristau, D., Bruns, S., Vergöhl, M., Stolze, M., Held, M., Niederwald, H., Koch, T., Riggers, W., Burdack, P., Mark, G., Schäfer, R., Mewes, S., Bischoff, M., Arntzen, M., Eisenkrämer, F., Lappschies, M., Jakobs, S., Koch, S., Baumgarten, B. and Tünnermann, A., "Mixed oxide coatings for optics", Applied Optics 50(9), 69-74 (2011).
6. Beermann, N., Ehlers, H. and Ristau, D., "Ion source characterization based on an array of retarding field analyzers", Proc. SPIE 5963, 59630H (2005).
7. Dieckmann, M., "SPEKTRUM, Thin Film Design Software", Laser Zentrum Hannover e.V., 1990-2011.
8. Ristau, D., Ehlers, H., Schlichting, S. and Lappschies, M., "State of the art in deterministic production of optical thin films", Proc. SPIE 7101, 71010C (2008).
9. Mende, M., Günster, S., Ehlers, H. and Ristau, D., "Optical Properties of Ion Beam Sputtered Oxide Mixture Coatings", Opt. Interfer. Coatings, OSA Technical Digest, ThA4 (2010).
10. Lappschies, M., Jupé, M. and Ristau, D., "Extension of Ion Beam Sputtered Oxide Mixtures into the UV Spectral Range", Opt. Interfer. Coatings, OSA Technical Digest, TuA7 (2007).
11. ISO11254:2000/2001, "Optics and optical instruments - Lasers and laser-related equipment - Test methods for laser-induced damage threshold", International Organization for Standardization.
12. ISO11551:2003, "Optics and optical instruments - Lasers and laser-related equipment - Test method for absorptance of optical laser components", International Organization for Standardization.
13. 2 mixtures for nanosecond and femtosecond pulses", Proc. SPIE 7842, 784207 (2010).