Bds thin film damage competition

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7132, Issue , 2008, Pages

  Stolz, Christopher J ^a   Thomas, Michael D ^b   Griffin, Andrew J ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Spica Technologies Inc   (United States)

Author keywords

1064 nm; 5 ns pulse length; Damage testing; Mirror; Multilayer; Thin film

Indexed keywords

1064 NM; 5 NS PULSE LENGTH; BLIND TESTS; COATING MATERIALS; CURRENT STATUS; DAMAGE TESTING; DAMAGE TESTS; DEPOSITION PROCESS; GOVERNMENT SECTORS; HIGH REFLECTORS; LASER RESISTANCES; MULTI-LAYER COATINGS; MULTILAYER; NORMAL INCIDENCES; THIN FILM LASERS;

COMPETITION; LASER DAMAGE; LASERS; MIRRORS; MULTILAYERS; OPTICAL MATERIALS; OPTICAL TESTING; THIN FILM DEVICES;

FILM PREPARATION;

EID: 62149119546     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.806287     Document Type: Conference Paper

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