Imaging of highly inhomogeneous strain field in nanocrystals using x-ray Bragg ptychography: A numerical study

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 14, 2011, Pages

  Godard, P ^a   Allain, M ^a   Chamard, V ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80155214326     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.144109     Document Type: Article

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