메뉴 건너뛰기




Volumn 13, Issue 1, 2012, Pages 66-70

Electric field and charge distribution imaging with sub-micron resolution in an organic Thin-Film Transistor

Author keywords

Confocal microscopy; Copper Fluorinated Phthalocyanine; Electro Reflectance; Mapping; Stark shift spectroscopy; Thin Film Transistor

Indexed keywords

CONFOCAL MICROSCOPY; ELECTRIC FIELDS; FIELD EFFECT TRANSISTORS; MAPPING; PROBES; RADIATION DETECTORS; REFLECTION; THIN FILM CIRCUITS; THIN FILMS;

EID: 80155140303     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2011.09.023     Document Type: Article
Times cited : (16)

References (34)
  • 6
    • 2342486652 scopus 로고    scopus 로고
    • S.R. Forrest Nature 428 6986 2004 911 918
    • (2004) Nature , vol.428 , Issue.6986 , pp. 911-918
    • Forrest, S.R.1
  • 30
    • 84855278998 scopus 로고    scopus 로고
    • 2 (r) cos(2·2πft)
    • 2(r) cos(2·2πft).
  • 34
    • 83655174281 scopus 로고    scopus 로고
    • N. Majumdar, S. Mukhopadhyay, v1 (2006)
    • N. Majumdar, S. Mukhopadhyay, v1 (2006).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.