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Volumn 110, Issue 7, 2011, Pages

Investigation of thermal transport degradation in rough Si nanowires

Author keywords

[No Author keywords available]

Indexed keywords

DISORDERED STRUCTURES; FLAT DISPERSION; MODE MISMATCH; OXIDE LAYER; PHONON BANDS; PHONON LOCALIZATION; QUANTUM TRANSPORT; ROOT MEAN SQUARE; ROUGH SURFACES; SI NANOWIRE; SIMULATION RESULT; THERMAL CONDUCTANCE; THERMAL TRANSPORT; UNIT CELLS;

EID: 80055001465     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3644993     Document Type: Article
Times cited : (35)

References (24)
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  • 12
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  • 13
    • 35448989286 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.76.155313
    • P. G. Murphy and J. E. Moore, Phys. Rev. B 76, 155313 (2007). 10.1103/PhysRevB.76.155313
    • (2007) Phys. Rev. B , vol.76 , pp. 155313
    • Murphy, P.G.1    Moore, J.E.2
  • 14
    • 0001472582 scopus 로고
    • 10.1103/PhysRevB.48.17938
    • Z. Sui and I. P. Herman, Phys. Rev. B 48, 17938 (1993). 10.1103/PhysRevB.48.17938
    • (1993) Phys. Rev. B , vol.48 , pp. 17938
    • Sui, Z.1    Herman, I.P.2
  • 19
    • 33947147843 scopus 로고    scopus 로고
    • Atomistic treatment of interface roughness in Si nanowire transistors with different channel orientations
    • DOI 10.1063/1.2711275
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    • Luisier, M.1    Schenk, A.2    Fichtner, W.3
  • 22
    • 0035364878 scopus 로고    scopus 로고
    • On the mobility versus drain current relation for a nanoscale MOSFET
    • DOI 10.1109/55.924846, PII S0741310601046663
    • M. S. Lundstrom, IEEE Electron Device Lett. 22, 293 (2001). 10.1109/55.924846 (Pubitemid 32584999)
    • (2001) IEEE Electron Device Letters , vol.22 , Issue.6 , pp. 293-295
    • Lundstrom, M.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.