Narrow band defect luminescence from Al-doped ZnO probed by scanning tunneling cathodoluminescence

Applied Physics Letters

Volumn 99, Issue 15, 2011, Pages

  Likovich, Edward M ^a   Jaramillo, Rafael ^a   Russell, Kasey J ^a   Ramanathan, Shriram ^a   Narayanamurti, Venkatesh ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AL-DOPED ZNO; NARROW BANDS; NEAR-SURFACE DEFECTS; OPTICALLY ACTIVE; OPTICALLY ACTIVE DEFECTS; SCANNING TUNNELING MICROSCOPES; TRANSPARENT CONDUCTORS;

ALUMINUM; CATHODOLUMINESCENCE; DEFECTS; OPTICAL PROPERTIES; OXYGEN VACANCIES; SURFACE TOPOGRAPHY; ZINC OXIDE;

SURFACE DEFECTS;

EID: 80054984628     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3647622     Document Type: Article

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