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Volumn 83, Issue 7, 2011, Pages

Scanning tunneling microscope investigation of local density of states in Al-doped ZnO thin films

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EID: 79961099588     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.075430     Document Type: Article
Times cited : (21)

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