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Volumn 17, Issue 5, 2011, Pages 752-758

Electron image series reconstruction of twin interfaces in inp superlattice nanowires

Author keywords

aberration correction; exit wave reconstruction; indium phosphide; nanowires; transmission electron microscopy; twinning

Indexed keywords


EID: 80054896161     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000493     Document Type: Article
Times cited : (4)

References (31)
  • 2
    • 33947138803 scopus 로고    scopus 로고
    • Epitaxial growth of III-V nanowires on group IV substrates
    • Bakkers, E.P.A.M., Borgström, M.T. & Verheijen, M.A. (2007). Epitaxial growth of III-V nanowires on group IV substrates. MRS Bull 32, 117-122. (Pubitemid 46396567)
    • (2007) MRS Bulletin , vol.32 , Issue.2 , pp. 117-122
    • Bakkers, E.P.A.M.1    Borgstrom, M.T.2    Verheijen, M.A.3
  • 6
    • 33846056519 scopus 로고    scopus 로고
    • The effect of Mg doping on GaN nanowires
    • DOI 10.1088/0957-4484/17/23/004, PII S0957448406277651, 004
    • Cimpoiasu, E., Stern, E., Klie, R., Munden, R.A., Cheng, G. & Reed, M.A. (2006). The effect of Mg doping on GaN nanowires. Nanotechnology 17, 5735-5739. (Pubitemid 46069943)
    • (2006) Nanotechnology , vol.17 , Issue.23 , pp. 5735-5739
    • Cimpoiasu, E.1    Stern, E.2    Klie, R.3    Munden, R.A.4    Cheng, G.5    Reed, M.A.6
  • 7
    • 38349134273 scopus 로고    scopus 로고
    • Growth thermodynamics of nanowires and its application to polytypism of zinc blende III-V nanowires
    • Dubrovskii, V.G. & Sibirev, N.V. (2008). Growth thermodynamics of nanowires and its application to polytypism of zinc blende III-V nanowires. Phys Rev B 77, 035414.
    • (2008) Phys Rev B , vol.77 , pp. 035414
    • Dubrovskii, V.G.1    Sibirev, N.V.2
  • 8
    • 59349113596 scopus 로고    scopus 로고
    • Controllable p-type doping of GaAs nanowires during vapor-liquid-solid growth
    • Gutsche, C., Regolin, I., Blekker, K., Lysov, A., Prost, W. & Tegude, F.J. (2009). Controllable p-type doping of GaAs nanowires during vapor-liquid-solid growth. J Appl Phys 105, 024305.
    • (2009) J Appl Phys , vol.105 , pp. 024305
    • Gutsche, C.1    Regolin, I.2    Blekker, K.3    Lysov, A.4    Prost, W.5    Tegude, F.J.6
  • 10
    • 80054920756 scopus 로고
    • HREM of defects in silicon at twin intersections
    • Hetherington, C.J.D. (1990). HREM of defects in silicon at twin intersections. Mat Res Soc Symp Proc 183, 123-134.
    • (1990) Mat Res Soc Symp Proc , vol.183 , pp. 123-134
    • Hetherington, C.J.D.1
  • 11
    • 14944376634 scopus 로고    scopus 로고
    • A versatile double aberration-corrected, energy filtered HREM/STEM for materials science
    • DOI 10.1016/j.ultramic.2004.11.010, PII S0304399104002086, Proceedings of the Ninth Conference on Frontiers of Electron Microscopy in Materials Science
    • Hutchison, J.L., Titchmarsh, J.M., Cockayne, D.J.H., Doole, R.C., Hetherington, C.J.D., Kirkland, A.I. & Sawada, H. (2005). A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Ultramicroscopy 103, 7-15. (Pubitemid 40363979)
    • (2005) Ultramicroscopy , vol.103 , Issue.1 , pp. 7-15
    • Hutchison, J.L.1    Titchmarsh, J.M.2    Cockayne, D.J.H.3    Doole, R.C.4    Hetherington, C.J.D.5    Kirkland, A.I.6    Sawada, H.7
  • 12
    • 2042427910 scopus 로고    scopus 로고
    • High-resolution transmission electron microscopy using negative spherical aberration
    • DOI 10.1017/S1431927604040425
    • Jia, C.-L., Lentzen, M. & Urban, K.W. (2004). High-resolution transmission electron microscopy using negative spherical aberration. Microsc Microanal 10, 174-184. (Pubitemid 38531942)
    • (2004) Microscopy and Microanalysis , vol.10 , Issue.2 , pp. 174-184
    • Jia, C.-L.1    Lentzen, M.2    Urban, K.3
  • 14
    • 33645681715 scopus 로고    scopus 로고
    • Crystal-structure-dependent photoluminescence from InP nanowires
    • Mattila, M., Hakkarainen, T., Mulot, M. & Lipsanen, H. (2006). Crystal-structure-dependent photoluminescence from InP nanowires. Nanotechnology 17, 1580-1583.
    • (2006) Nanotechnology , vol.17 , pp. 1580-1583
    • Mattila, M.1    Hakkarainen, T.2    Mulot, M.3    Lipsanen, H.4
  • 15
    • 0033622363 scopus 로고    scopus 로고
    • Experimental characterisation of CCD cameras for HREM at 300 kV
    • DOI 10.1016/S0304-3991(00)00046-2, PII S0304399100000462
    • Meyer, R.R., Kirkland, A.I., Dunin-Borkowski, R.E. & Hutchison, J.L. (2000). Experimental characterisation of CCD cameras for HREM at 300 kV. Ultramicroscopy 85, 9-13. (Pubitemid 30625152)
    • (2000) Ultramicroscopy , vol.85 , Issue.1 , pp. 9-13
    • Meyer, R.R.1    Kirkland, A.I.2    Dunin-Borkowski, R.E.3    Hutchison, J.L.4
  • 16
    • 0036294470 scopus 로고    scopus 로고
    • A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations
    • DOI 10.1016/S0304-3991(02)00071-2, PII S0304399102000712
    • Meyer, R.R., Kirkland, A.I. & Saxton, W.O. (2002). A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations. Ultramicroscopy 92, 89-109. (Pubitemid 34718144)
    • (2002) Ultramicroscopy , vol.92 , Issue.2 , pp. 89-109
    • Meyer, R.R.1    Kirkland, A.I.2    Saxton, W.O.3
  • 17
    • 3342987423 scopus 로고    scopus 로고
    • Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy
    • Mikkelsen, A., Ouattara, L., Andersen, J.N., Samuelson, L., Seifert, W. & Lundgren, E. (2004). Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy. Nat Mater 3, 519-523.
    • (2004) Nat Mater , vol.3 , pp. 519-523
    • Mikkelsen, A.1    Ouattara, L.2    Andersen, J.N.3    Samuelson, L.4    Seifert, W.5    Lundgren, E.6
  • 20
    • 33748594961 scopus 로고    scopus 로고
    • Nanowire photonics
    • DOI 10.1016/S1369-7021(06)71652-2, PII S1369702106716522
    • Pauzauskie, P. & Yang, P. (2006). Nanowire photonics. Mater Today 9, 36-45. (Pubitemid 44380403)
    • (2006) Materials Today , vol.9 , Issue.10 , pp. 36-45
    • Pauzauskie, P.J.1    Yang, P.2
  • 22
    • 33644878950 scopus 로고    scopus 로고
    • Three-dimensional nanoscale composition mapping of semiconductor nanowires
    • DOI 10.1021/nl051602p
    • Perea, D.E., Allen, J.E., May, J.S., Wessels, B.W., Seidman, D.N. & Lauhon, L.J. (2006). Three-dimensional nanoscale composition mapping of semiconductor nanowires. Nano Lett 6, 181-185. (Pubitemid 43382948)
    • (2006) Nano Letters , vol.6 , Issue.2 , pp. 181-185
    • Perea, D.E.1    Allen, J.E.2    May, S.J.3    Wessels, B.W.4    Seidman, D.N.5    Lauhon, L.J.6
  • 26
    • 2042424742 scopus 로고    scopus 로고
    • Spherical aberration correction in tandem with exit-plane wave function reconstruction: Interlocking tools for the atomic scale imaging of lattice defects in GaAs
    • DOI 10.1017/S1431927604040395
    • Tillmann, K., Urban, K.W. & Thust, A. (2004). Spherical aberration correction in tandem with exit-plane wave function reconstruction: Interlocking tools for the atomic scale imaging of lattice defects in GaAs. Microsc Microanal 10, 185-198. (Pubitemid 38531943)
    • (2004) Microscopy and Microanalysis , vol.10 , Issue.2 , pp. 185-198
    • Tillmann, K.1    Thust, A.2    Urban, K.3
  • 27
    • 0032077383 scopus 로고    scopus 로고
    • Residual wave aberrations in the first spherical aberration corrected transmission electron microscope
    • DOI 10.1016/S0304-3991(97)00102-2, PII S0304399197001022
    • Uhlemann, S. & Haider, M. (1998). Residual wave aberrations in the first spherical aberration corrected transmission electron microscope. Ultramicroscopy 72, 109-119. (Pubitemid 28248306)
    • (1998) Ultramicroscopy , vol.72 , Issue.3-4 , pp. 109-119
    • Uhlemann, S.1    Haider, M.2
  • 30
    • 51249122407 scopus 로고    scopus 로고
    • Theoretical investigations on the formation of wurtzite segments in group III-V semiconductor nanowires
    • Yamashita, T., Sano, K., Akiyama, T., Nakamura, K. & Ito, T. (2008). Theoretical investigations on the formation of wurtzite segments in group III-V semiconductor nanowires. Appl Surf Sci 254, 7668-7671.
    • (2008) Appl Surf Sci , vol.254 , pp. 7668-7671
    • Yamashita, T.1    Sano, K.2    Akiyama, T.3    Nakamura, K.4    Ito, T.5
  • 31
    • 0018227155 scopus 로고
    • Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms
    • Zemlin, F., Weiss, K., Schiske, P. & Kunath, W. (1978). Comafree alignment of high resolution electron microscopes with the aid of optical diffractograms. Ultramicroscopy 3, 49-60. (Pubitemid 9164298)
    • (1978) Ultramicroscopy , vol.3 , Issue.1 , pp. 49-60
    • Zemlin, F.1    Weiss, K.2    Schiske, P.3


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