Study of spin coated multilayer zirconia and silica films for non-quarterwavelength optical design based antireflection effect at 1,054 nm

Journal of Sol-Gel Science and Technology

Volumn 60, Issue 2, 2011, Pages 116-124

  Das, Shyamal ^a,b   Jana, Sunirmal ^a   Das, Nilanjana ^a   Ghosh, Soumya Shankar ^a   Biswas, Prasanta Kumar ^a  

^a CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE   (India)

^b CGCRI   (India)

Author keywords

Antireflection property; Film thickness; Multilayer zirconia; Refractive index; Sol gel process

Indexed keywords

AFM IMAGE; ANTI-REFLECTION; ANTI-REFLECTION EFFECTS; BOROSILICATE CROWN GLASS; COATED PRODUCTS; DESIGN WAVELENGTH; MIDDLE LAYER; OPTICAL PARAMETER; PHYSICAL THICKNESS; SILICA FILM; SOL-GEL SPIN COATING; SPECULAR REFLECTIONS; SURFACE FEATURE; TWO-MATERIALS;

BOROSILICATE GLASS; COATINGS; GELS; LIGHT REFRACTION; MULTILAYER FILMS; MULTILAYERS; OPTICAL DESIGN; REFRACTIVE INDEX; REFRACTOMETERS; SILICA; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACE ROUGHNESS; SURFACES; ZIRCONIA;

OPTICAL MULTILAYERS;

EID: 80054890816     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-011-2564-y     Document Type: Article

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