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Volumn 38, Issue 10, 1999, Pages 1679-1682

Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; LUMINESCENT DEVICES; OPTICAL GLASS; PHASE MODULATION; PHASE SHIFT; REFRACTIVE INDEX; SURFACE ROUGHNESS;

EID: 0033336689     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602038     Document Type: Article
Times cited : (10)

References (8)
  • 1
    • 84975568379 scopus 로고
    • New measurement system for fault location in optical waveguide devices based on an interferometric technique
    • K. Takeda, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1603-1606 (1987).
    • (1987) Appl. Opt. , vol.26 , pp. 1603-1606
    • Takeda, K.1    Yokohama, I.2    Chida, K.3    Noda, J.4
  • 2
    • 0000142682 scopus 로고
    • Measurement of corneal thickness by low-coherence interferometry
    • C. K. Hitzenberger, "Measurement of corneal thickness by low-coherence interferometry," Appl. Opt. 31, 6637-6642 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 6637-6642
    • Hitzenberger, C.K.1
  • 3
    • 0031489455 scopus 로고    scopus 로고
    • Simultaneous measurement of refractive index and thickness of transparent plates by low coherence interferometry
    • M. Ohmi, T. Shiraishi, H. Tajiri, and M. Haruna, "Simultaneous measurement of refractive index and thickness of transparent plates by low coherence interferometry," Opt. Rev. 4, 507-515 (1997).
    • (1997) Opt. Rev. , vol.4 , pp. 507-515
    • Ohmi, M.1    Shiraishi, T.2    Tajiri, H.3    Haruna, M.4
  • 4
    • 0000520604 scopus 로고    scopus 로고
    • Imaging of hard-and soft-tissue structure in the oral cavity by optical coherence tomography
    • B. W. Colston, Jr., M. J. Everett, L. B. D. Silva, L. L. Otis, P. Stroeve, and H. Nathel, "Imaging of hard-and soft-tissue structure in the oral cavity by optical coherence tomography," Appl. Opt. 37, 3582-3585 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 3582-3585
    • Colston B.W., Jr.1    Everett, M.J.2    Silva, L.B.D.3    Otis, L.L.4    Stroeve, P.5    Nathel, H.6
  • 5
    • 0001615193 scopus 로고
    • Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry
    • K. Okada, H. Sakuta, T. Ose, and J. Tsujiuchi, "Separate measurements of surface shapes and refractive index inhomogeneity of an optical element using tunable-source phase shifting interferometry," Appl. Opt. 29, 3280-3285 (1990).
    • (1990) Appl. Opt. , vol.29 , pp. 3280-3285
    • Okada, K.1    Sakuta, H.2    Ose, T.3    Tsujiuchi, J.4
  • 6
    • 69949166537 scopus 로고
    • Sinusoidal phase modulating interferometry for surface profile measurement
    • O. Sasaki and H. Okazaki, "Sinusoidal phase modulating interferometry for surface profile measurement," Appl. Opt. 25, 3137-3140 (1986).
    • (1986) Appl. Opt. , vol.25 , pp. 3137-3140
    • Sasaki, O.1    Okazaki, H.2
  • 7
    • 0011534881 scopus 로고    scopus 로고
    • Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement
    • O. Sasaki, Y. Ikeda, and T. Suzuki, "Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement," Appl. Opt. 37, 5126-5131 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 5126-5131
    • Sasaki, O.1    Ikeda, Y.2    Suzuki, T.3
  • 8
    • 0029487342 scopus 로고
    • Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer
    • O. Sasaki, Y. Takebayashi, X. Wang, and T. Suzuki, "Exact measurement of flat surface profiles by object shifts in a phase-conjugate Fizeau interferometer," Opt. Eng. 34, 2957-2963 (1995).
    • (1995) Opt. Eng. , vol.34 , pp. 2957-2963
    • Sasaki, O.1    Takebayashi, Y.2    Wang, X.3    Suzuki, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.