Prognostics of failures in embedded planar capacitors using model-based and data-driven approaches

Journal of Intelligent Material Systems and Structures

Volumn 22, Issue 12, 2011, Pages 1293-1304

  Alam, Mohammed A ^a   Azarian, Michael H ^a   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

embedded planar capacitors; polymer ceramic nanocomposites; reliability; temperature and voltage aging.

Indexed keywords

CU LAYERS; DATA-DRIVEN; DATA-DRIVEN APPROACH; DISSIPATION FACTORS; EARLY DETECTION; ELECTRICAL PARAMETER; ELECTRICAL PERFORMANCE; ELEVATED TEMPERATURE; IN-SITU; INSULATION RESISTANCE; MAHALANOBIS DISTANCE METHOD; MULTI-LAYERED; OPERATING FREQUENCY; PARALLEL PLATE CAPACITORS; PLANAR CAPACITORS; POLYMER-CERAMIC NANOCOMPOSITE; SUPPLY VOLTAGES; TIME TO FAILURE;

BARIUM; BARIUM TITANATE; CAPACITANCE; FAILURE ANALYSIS; MILITARY APPLICATIONS; NANOCOMPOSITES; PRINTED CIRCUIT BOARDS; SPACE APPLICATIONS;

CAPACITORS;

EID: 80053999363     PISSN: 1045389X     EISSN: 15308138     Source Type: Journal    
DOI: 10.1177/1045389X11416024     Document Type: Conference Paper

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