Prognostics of ceramic capacitor temperature-humidity-bias reliability using Mahalanobis distance analysis

Circuit World

Volumn 33, Issue 3, 2007, Pages 21-28

  Nie, Lei ^a   Azaruan, Michael H ^a   Keimasi, Mohammadreza ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Capacitors; Ceramics; Humidity; Reliability management; Temperature

Indexed keywords

FAILURE (MECHANICAL); MOISTURE; MULTILAYERS; RELIABILITY; TEMPERATURE;

INTERMITTENT FAILURES; MULTILAYER CERAMIC CAPACITORS (MLCCS); RELIABILITY MANAGEMENT;

CERAMIC CAPACITORS;

EID: 42149118958     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: 10.1108/03056120710776988     Document Type: Article

References (7)

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2. Mathew, S., Rodgers, P., Eveloy, V., Vichare, P. and Pecht, M. (2006), "A methodology for assessing the remaining life of electronic products", International Journal of Performability Engineering, Vol. 2 No. 4, pp. 383-95.
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5. Taguchi, G., Chowdhury, S. and Wu, Y. (2001), The Mahalanobis - Taguchi System, McGraw-Hill, New York, NY.
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7. Woodall, W.H., Koudelik, R., Tsui, K.L, Kim, S.B., Stoumbos, S.B. and Carvounis, Z.G. (2003), "A review and analysis of the Mahalanobis - Taguchi System", Technometrics, Vol. 45 No. 1, pp. 1-15.