Reliability of multilayer ceramic capacitors with nickel electrodes

Journal of Power Sources

Volumn 60, Issue 2, 1996, Pages 199-203

  Yamamatsu, J ^a   Kawano, N ^a   Arashi, T ^a   Sato, A ^a   Nakano, Y ^a   Nomura, T ^a  

^a TDK CORPORATION   (Japan)

Author keywords

Aging; Degradation; Multilayer ceramic capacitors; Nickel electrodes; Reliability

Indexed keywords

AGING OF MATERIALS; CAPACITANCE; DEGRADATION; ELECTRODES; FIRING (OF MATERIALS); NICKEL; OXIDATION; RELIABILITY;

MULTILAYER CAPACITORS;

CERAMIC CAPACITORS;

EID: 0030157096     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(96)80011-5     Document Type: Article

References (30)

1. T. Nomura, S. Sumita, Y. Nakano and K. Nishiyama, Proc. 5th US -Japan Seminar on Dielectric and Piezoelectric Ceramics, Kyoto, Japan, 1990, pp. 29-32.
2. S. Sumita, M. Ikeda, Y. Nakano, K. Nishiyama and T. Nomura, J. Am. Ceram. Soc., 74 (1991) 2739-2746.
3. M. Ikeda, Y. Izumi, M. Yoshida, Y. Nakano, K. Nishiyama, S. Sumita and T. Nomura, Proc. Symp. Multilayer Ceramic Reliability, PA, USA, 1991, 87-101.
4. M. Shiojiri, T. Isshiki, H. Saijo, M. Tsujikura, A. Nakada, Y. Nakano, M. Ikeda and T. Nomura, Phys. Status Solidi A, 129 (1992) 353.
5. M. Shiojiri, T. Isshiki, H. Saijo, M. Tsujikura, Y. Yabuuchi, A. Nakada, Y. Nakano, M. Ikeda and T. Nomura, Proc. 5th Asia-Pacific Electron Microscopy Conference, Beijing, China, Aug. 1992, pp. 2-6.
6. T. Nomura, A. Sato and Y. Nakano, J. Soc. Mater. Eng. Res., 5 (1) (1992) 44-53.
7. T. Nomura, A. Sato, A. Hitomi and Y. Nakano, Funtai Oyobi Funmatsuyakin, 39 (1992) 590-594.
8. T. Nomura, Y. Izumi and Y. Nakano, Funtai Oyobi Funmatsuyakin, 39 (1992) 618-623.
9. T. Nomura and Y. Nakano, Denshi Tokyo, 31 (1993) 168-172.
10. A. Hitomi, A. Sato, Y. Nakano and T. Nomura, Funtai Oyobi Funmatsuyakin, 40 (1993) 455-460.
11. A. Sato, A. Hitomi, Y. Nakano and T. Nomura, Funtai Oyobi Funmatsuyakin, 40 (1993) 545-549.
12. Y. Nakano, A. Sato, A. Hitomi and T. Nomura, Ceram. Trans., 32 (1993) 119-128.
13. T. Nomura, A. Hitomi, A. Sato and Y. Nomura, Funtai Oyobi Funmatsuyakin, 40 (1993) 677-681.
14. Y. Nakano, J. Yamamatsu and T. Nomura, Proc. 6th Reliability Symp., Tokyo, Japan, 1993, pp. 37-40.
15. T. Arashi, Y. Nakano, A. Sato, J. Yamamatsu and T. Nomura, Funtai Oyobi Funmatsuyakin, 41 (1994) 959-963.
16. J. Yamamatsu and T. Nomura, Funtai Oyobi Funmatsuyakin, 41 (1994) 1042-1047.
17. Y. Nakano, A. Sato, A. Hitomi and T. Nomura, J. Soc. Mater. Eng. Res., 7 (1994) 21-27.
18. T.I. Prokopowicz and A.R. Vaskas, ECOM-90705-F, NTIS AD-864063, 1969, p. 175.
19. W.J. Minford, IEEE Trans. Components Hybrids Manuf. Technol., CHMT-5 (1982) 297-300.
20. R. Munikoti and P. Dhar, IEEE Trans. Components Hybrids Manuf. Technol., CHMT-11 (4) (1988) 342-345.
21. B.S. Rawal and N.H. Chan. AVX Tech. Rep., (1984).
22. J. Rodel and G. Tomandl, J. Mater. Sci., 19 (1984) 3515-3523.
23. K. Lehovec and G.A. Shirn, J. Appl. Phys., 33 (1962) 2036.
24. K. Yoo, C. Larry, C. Burton and F.W. Stephenson, IEEE Trans. Components Hybrids Manuf. Technol., CHMT-10 (1987) 274-282.
25. R. Waser, T. Baiatu and K. Hardtl, J. Am. Ceram. Soc., 3 (1990) 1645-1653.
26. E. Loh, J. Appl. Phys., 53 (1982) 6229.
27. F.A. Kröger and V.J. Vink, Solid State Physics, 3 (1956) 307-435.
28. B.H. Marks, Electronics, 21 (8) (1948) 116-120.
29. W.P. Mason, J. Acoust. Soc. Am., 27 (1955) 73-85.
30. N. Fujikawa, Nippon Ceramics Kyokai Denshizairyou-bukai Seminar, Tokyo, Japan, 1990, p. 86.