Nanoscale ferroelectric switching behavior at charged domain boundaries studied by angle-resolved piezoresponse force microscopy

Applied Physics Letters

Volumn 99, Issue 14, 2011, Pages

  Park, Moonkyu ^a   Hong, Seungbum ^a,b   Kim, Jiyoon ^a   Hong, Jongin ^c   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Chung Ang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE VOLTAGES; DOMAIN BOUNDARY; DOMAIN STRUCTURE; FERROELECTRIC SWITCHING; NANO SCALE; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION CHARGES; POLARIZATION DISCONTINUITY; POLYCRYSTALLINE; PZT; PZT THIN FILM;

LEAD; POLARIZATION; THIN FILMS; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 80053947838     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3646761     Document Type: Article

References (19)

1. H. Ko, K. Ryu, H. Park, C. Park, D. Jeon, Y. K. Kim, J. Jung, D.-K. Min, Y. Kim, H. N. Lee, Y. Park, H. Shin, and S. Hong, Nano Lett. 11, 1428 (2011). 10.1021/nl103372a
2. N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N. Y. Park, G. B. Stephenson, I. Stolitchnov, A. K. Taganstev, D. V. Taylor, T. Yamada, and S. Streiffer, J. Appl. Phys. 100, 051606 (2006). 10.1063/1.2336999 (Pubitemid 44424530)
3. M. Kim, M. Hoegen, J. Dugundji, and B. L. Wardle, Smart Mater. Struct. 19, 045023 (2010). 10.1088/0964-1726/19/4/045023
4. A. Gruverman and A. Kholkin, Rep. Prog. Phys. 69, 2443 (2006). 10.1088/0034-4885/69/8/R04 (Pubitemid 44144177)
5. S. V. Kalinin, A. N. Morozovska, L. Q. Chen, and B. J. Rodriguez, Rep. Prog. Phys. 73, 056502 (2010). 10.1088/0034-4885/73/5/056502
6. S. Hong, J. Woo, H. Shin, J. U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim, and K. No, J. Appl. Phys. 89, 1377 (2001). 10.1063/1.1331654 (Pubitemid 33661899)
7. A. Gruverman, A. Kholkin, A. Kingon, and H. Tokumoto, Appl. Phys. Lett. 78, 2751 (2001). 10.1063/1.1366644
8. V. Nagarajan, S. Aggarwal, A. Gruverman, R. Ramesh, and R. Waser, Appl. Phys. Lett. 86, 262910 (2005). 10.1063/1.1977183 (Pubitemid 40983223)
9. S. V. Kalinin, B. J. Rodriguez, S. Jesse, E. Karapetian, B. Mirman, E. A. Eliseev, and A. N. Morozovska, Annu. Rev. Mater. Res. 37, 189 (2007). 10.1146/annurev.matsci.37.052506.084323 (Pubitemid 47500080)
10. B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross, J. Appl. Phys. 95, 1958 (2004). 10.1063/1.1638889
11. S. Hong, J. A. Klug, M. Park, A. Imre, M. J. Bedzyk, K. No, A. Petford-Long, and O. Auciello, J. Appl. Phys. 105, 061619 (2009). 10.1063/1.3055412
12. J. Seidel, L. W. Martin, Q. He, Q. Zhan, Y.-H. Chu, A. Rother, M. E. Hawkridge, P. Maksymovych, P. Yu, M. Gajek, N. Balke, S. V. Kalinin, S. Gemming, F. Wang, G. Catalan, J. F. Scott, N. A. Spaldin, J. Orenstein, and R. Ramesh, Nature Mater. 8, 229 (2009). 10.1038/nmat2373
13. M. Park, S. Hong, J. A. Klug, M. J. Bedzyk, O. Auciello, K. No, and A. Petford-Long, Appl. Phys. Lett. 97, 112907 (2010). 10.1063/1.3487933
14. See supplementary material at http://dx.doi.org/10.1063/1.3646761 E-APPLAB-99-093140 for sample information, detailed experimental conditions of PFM measurements and measured hysteresis loops.
15. C. Harnagea, A. Pignolet, M. Alexe, and D. Hesse, Integr. Ferroelectr. 44, 113 (2002). 10.1080/713718197
16. L. F. Zagonel, M. Burer, A. Bailly, O. Renault, M. Hoffmann, S.-J. Shih, D. Cockayne, and N. Barrett, J. Phys.: Condens. Matter 21, 314013 (2009). 10.1088/0953-8984/21/31/314013
17. J. W. Hong, K. H. Noh, S. Park, S. I. Kwun, and Z. G. Khim, Phys. Rev. B 58, 5078 (1998). 10.1103/PhysRevB.58.5078
18. Y. Kim, M. Park, S. Bhlmann, S. Hong, Y. K. Kim, H. Ko, J. Kim, and K. No, J. Appl. Phys. 107, 054103 (2010). 10.1063/1.3290953
19. Y. Kim, S. Bhlmann, J. Kim, M. Park, K. No, Y. K. Kim, and S. Hong, Appl. Phys. Lett. 91, 052906 (2007). 10.1063/1.2761502 (Pubitemid 47210828)