Three-dimensional ferroelectric domain imaging of epitaxial BiFeO 3 thin films using angle-resolved piezoresponse force microscopy

Applied Physics Letters

Volumn 97, Issue 11, 2010, Pages

  Park, Moonkyu ^a,b   Hong, Seungbum ^a   Klug, Jeffrey A ^a,c   Bedzyk, Michael J ^a,c   Auciello, Orlando ^a   No, Kwangsoo ^b   Petford Long, Amanda ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN BOUNDARY; FERROELECTRIC DOMAINS; IN-PLANE; IN-PLANE POLARIZATION; PHASE SIGNALS; PIEZORESPONSE FORCE MICROSCOPY; SRTIO; SURFACE NORMALS;

FERROELECTRIC MATERIALS; FERROELECTRICITY; POLARIZATION; SINGLE CRYSTALS; VAPOR DEPOSITION;

EPITAXIAL FILMS;

EID: 77956804545     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3487933     Document Type: Article

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