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Applied Physics A: Materials Science and Processing

Volumn 104, Issue 4, 2011, Pages 1069-1073

Top electrode effects on resistive switching behavior in CuO thin films

(5) Li, Ying a Zhao, Gaoyang a Su, Jian a Shen, Erfeng a Ren, Yang a

a XI'AN UNIVERSITY OF TECHNOLOGY (China)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CONDUCTING PATHS; CU ELECTRODE; ELECTRODE EFFECTS; HIGH-RESISTANCE STATE; NON-POLAR; RESISTANCE REDUCTION; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; SWITCHING PROPERTIES; XRD;

MATERIALS PROPERTIES; OXYGEN VACANCIES; SOL-GEL PROCESS; SWITCHING SYSTEMS; THIN FILMS;

SWITCHING;

EID: 80053910621 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-011-6371-7 Document Type: Article

Times cited : (15)

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