Structure of copper-doped tungsten oxide films for solid-state memory

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 1844-1848

  Gopalan, C ^a   Kozicki, M N ^a   Bhagat, S ^a   Puthen Thermadam, S C ^a   Alford, T L ^a   Mitkova, M ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Boise State University   (United States)

Author keywords

Microcrystallinity; Phonons; Raman scattering; X ray diffraction

Indexed keywords

COPPER; DATA STORAGE EQUIPMENT; DOPING (ADDITIVES); INTERCALATION; OXIDATION; PHONONS; RAMAN SPECTROSCOPY; THERMAL EVAPORATION; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

AUGER SPECTROSCOPY; MICROCRYSTALLINITY; PHOTOTHERMAL DIFFUSION; TUNGSTEN OXIDE;

METALLIC FILMS;

EID: 34247897217     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.02.054     Document Type: Article

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