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Volumn 32, Issue 10, 2011, Pages 1385-1387

Self-aligned coplanar a-IGZO TFTs and application to high-speed circuits

Author keywords

Amorphous indium gallium zinc oxide (a IGZO); coplanar; ring oscillator (RO); self aligned process; thin film transistor (TFT)

Indexed keywords

COPLANAR; FIELD-EFFECT MOBILITIES; GATE VOLTAGE SWING; HIGH-SPEED CIRCUITS; PARASITIC RESISTANCES; PROPAGATION DELAY TIME; RING OSCILLATOR; SELF-ALIGNED; SELF-ALIGNED PROCESS; SUPPLY VOLTAGES; TOTAL RESISTANCE;

EID: 80053563935     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2161568     Document Type: Article
Times cited : (186)

References (14)
  • 2
    • 80052430601 scopus 로고    scopus 로고
    • Highly stable amorphous-indium-gallium-zinc-oxide thin-film transistor using an etch stopper and a via-hole structure
    • Mar.
    • M. Mativenga, J. W. Choi, J. H. Hur, H. J. Kim, and J. Jang, "Highly stable amorphous-indium-gallium-zinc-oxide thin-film transistor using an etch stopper and a via-hole structure," J. Info. Display, vol. 12, no. 1, pp. 47-50, Mar. 2011.
    • (2011) J. Info. Display , vol.12 , Issue.1 , pp. 47-50
    • Mativenga, M.1    Choi, J.W.2    Hur, J.H.3    Kim, H.J.4    Jang, J.5
  • 3
    • 79151470685 scopus 로고    scopus 로고
    • Transparent flexible circuits based on amorphous-indium-gallium-zinc- oxide thin-film transistors
    • Feb
    • M. Mativenga, M. H. Choi, J. W. Choi, and J. Jang, "Transparent flexible circuits based on amorphous-indium-gallium-zinc-oxide thin-film transistors," IEEE Electron Device Lett., vol. 32, no. 2, pp. 170-172, Feb. 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.2 , pp. 170-172
    • Mativenga, M.1    Choi, M.H.2    Choi, J.W.3    Jang, J.4
  • 4
    • 85027925443 scopus 로고    scopus 로고
    • High-performance drain-offset a-IGZO thin-film transistors
    • May
    • M. Mativenga, M. H. Choi, D. H. Kang, and J. Jang, "High-performance drain-offset a-IGZO thin-film transistors," IEEE Electron Device Lett., vol. 32, no. 5, pp. 644-646, May 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.5 , pp. 644-646
    • Mativenga, M.1    Choi, M.H.2    Kang, D.H.3    Jang, J.4
  • 5
    • 70450211244 scopus 로고    scopus 로고
    • Self-aligned top-gate coplanar In-Ga-Zn-O thin-film transistors
    • Dec.
    • C. H.Wu, H. H. Hsieh, C.W. Chien, and C. C.Wu, "Self-aligned top-gate coplanar In-Ga-Zn-O thin-film transistors," J. Disp. Tech., vol. 5, no. 12, pp. 515-519, Dec. 2009.
    • (2009) J. Disp. Tech. , vol.5 , Issue.12 , pp. 515-519
    • Wu, C.H.1    Hsieh, H.H.2    Chien, C.W.3    Wu, C.C.4
  • 7
    • 77950071142 scopus 로고    scopus 로고
    • Fast all-transparent integrated circuits based on indium gallium zinc oxide thin-film transistors
    • Apr
    • A. Suresh, P.Wellenius, V. Baliga, H. Luo, L. M. Lunardi, and J. F. Muth, "Fast all-transparent integrated circuits based on indium gallium zinc oxide thin-film transistors," IEEE Electron Device Lett., vol. 31, no. 4, pp. 317-319, Apr. 2010.
    • (2010) IEEE Electron Device Lett. , vol.31 , Issue.4 , pp. 317-319
    • Suresh, A.1    Wellenius, P.2    Baliga, V.3    Luo, H.4    Lunardi, L.M.5    Muth, J.F.6
  • 8
    • 67349285093 scopus 로고    scopus 로고
    • Source/drain formation of self-aligned top-gate amorphous GaInZnO thin-film transistors by NH3 plasma treatment
    • Apr.
    • W. Kim, J. C. Park, C. J. Kim, I. H. Song, S. I. Kim, S. H. Park, H. Yin, H. I. Lee, E. H. Lee, and Y. S. Park, "Source/drain formation of self-aligned top-gate amorphous GaInZnO thin-film transistors by NH3 plasma treatment," IEEE Electron Device Lett., vol. 30, no. 4, pp. 374-376, Apr. 2009.
    • (2009) IEEE Electron Device Lett. , vol.30 , Issue.4 , pp. 374-376
    • Kim, W.1    Park, J.C.2    Kim, C.J.3    Song, I.H.4    Kim, S.I.5    Park, S.H.6    Yin, H.7    Lee, H.I.8    Lee, E.H.9    Park, Y.S.10
  • 9
    • 68349109731 scopus 로고    scopus 로고
    • Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors
    • Oct.
    • A. Valletta, M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana, and S. Leonardi, "Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors," Thin Solid Films, vol. 517, no. 23, pp. 6353-6357, Oct. 2009.
    • (2009) Thin Solid Films , vol.517 , Issue.23 , pp. 6353-6357
    • Valletta, A.1    Rapisarda, M.2    Mariucci, L.3    Pecora, A.4    Fortunato, G.5    Caligiore, C.6    Fontana, E.7    Tramontana, F.8    Leonardi, S.9
  • 10
    • 54149088432 scopus 로고    scopus 로고
    • Study on parasitic and channel resistance of poly-silicon thin-film transistors by metal-induced crystallization
    • Jul.
    • S. Saxena, J. H. Cheon, G. P. Kennedyy, J. H. Bae, and J. Jang, "Study on parasitic and channel resistance of poly-silicon thin-film transistors by metal-induced crystallization," J. Soc. Info. Display, vol. 16, no. 7, pp. 721-725, Jul. 2008.
    • (2008) J. Soc. Info. Display , vol.16 , Issue.7 , pp. 721-725
    • Saxena, S.1    Cheon, J.H.2    Kennedyy, G.P.3    Bae, J.H.4    Jang, J.5
  • 12
    • 77952471891 scopus 로고    scopus 로고
    • A novel amorphous InGaZnO thin film transistor structure without source/drain layer deposition
    • Mar.
    • B. D. Ahn, H. S. Shin, G. H. Kim, J. S. Park, and H. J. Kim, "A novel amorphous InGaZnO thin film transistor structure without source/drain layer deposition," Jpn. J. Appl. Phys., vol. 48, no. 3, pp. 03B019-1-03B019-4, Mar. 2009.
    • (2009) Jpn. J. Appl. Phys. , vol.48 , Issue.3
    • Ahn, B.D.1    Shin, H.S.2    Kim, G.H.3    Park, J.S.4    Kim, H.J.5
  • 13
    • 79957603203 scopus 로고    scopus 로고
    • High performance amorphous indium-gallium-zinc-oxide thin-film transistor with self-aligned etchstopper patterned by backside UV exposure
    • Jun
    • D. Geng, D. H. Kang, and J. Jang, "High performance amorphous indium-gallium-zinc-oxide thin-film transistor with self-aligned etchstopper patterned by backside UV exposure," IEEE Electron Device Lett., vol. 32, no. 6, pp. 758-760, Jun. 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.6 , pp. 758-760
    • Geng, D.1    Kang, D.H.2    Jang, J.3
  • 14
    • 33744527475 scopus 로고    scopus 로고
    • Dynamic characteristics of MICC polycrystalline thin film transistors
    • DOI 10.1016/j.jnoncrysol.2005.11.131, PII S0022309306003498
    • Y. D. Son, K. D. Yang, B. S. Bae, K. C. Park, and J. Jang, "Dynamic characteristics of MICC polycrystalline thin film transistors," J. Non-Crys. Solids, vol. 352, no. 9-20, pp. 1745-1748, Jun. 2006. (Pubitemid 43816545)
    • (2006) Journal of Non-Crystalline Solids , vol.352 , Issue.SPEC. ISS. , pp. 1745-1748
    • Son, Y.-D.1    Yang, K.-D.2    Bae, B.-S.3    Park, K.-C.4    Jang, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.