-
1
-
-
43049143507
-
Circuits using uniform TFTs based on amorphous In-Ga-Zn-O
-
Nov.
-
R. Hayashi, M. Ofuji, N. Kaji, K. Takahashi, K. Abe, H. Yabuta, M. Sano, H. Kumomi, K. Nomura, T. Kamiya,M. Hirano, and H. Hosono, "Circuits using uniform TFTs based on amorphous In-Ga-Zn-O," J. Soc. Info. Disp, vol. 15, no. 11, pp. 915-921, Nov. 2007.
-
(2007)
J. Soc. Info. Disp
, vol.15
, Issue.11
, pp. 915-921
-
-
Hayashi, R.1
Ofuji, M.2
Kaji, N.3
Takahashi, K.4
Abe, K.5
Yabuta, H.6
Sano, M.7
Kumomi, H.8
Nomura, K.9
Kamiya, T.10
Hirano, M.11
Hosono, H.12
-
2
-
-
80052430601
-
Highly stable amorphous-indium-gallium-zinc-oxide thin-film transistor using an etch stopper and a via-hole structure
-
Mar.
-
M. Mativenga, J. W. Choi, J. H. Hur, H. J. Kim, and J. Jang, "Highly stable amorphous-indium-gallium-zinc-oxide thin-film transistor using an etch stopper and a via-hole structure," J. Info. Display, vol. 12, no. 1, pp. 47-50, Mar. 2011.
-
(2011)
J. Info. Display
, vol.12
, Issue.1
, pp. 47-50
-
-
Mativenga, M.1
Choi, J.W.2
Hur, J.H.3
Kim, H.J.4
Jang, J.5
-
3
-
-
79151470685
-
Transparent flexible circuits based on amorphous-indium-gallium-zinc- oxide thin-film transistors
-
Feb
-
M. Mativenga, M. H. Choi, J. W. Choi, and J. Jang, "Transparent flexible circuits based on amorphous-indium-gallium-zinc-oxide thin-film transistors," IEEE Electron Device Lett., vol. 32, no. 2, pp. 170-172, Feb. 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.2
, pp. 170-172
-
-
Mativenga, M.1
Choi, M.H.2
Choi, J.W.3
Jang, J.4
-
4
-
-
85027925443
-
High-performance drain-offset a-IGZO thin-film transistors
-
May
-
M. Mativenga, M. H. Choi, D. H. Kang, and J. Jang, "High-performance drain-offset a-IGZO thin-film transistors," IEEE Electron Device Lett., vol. 32, no. 5, pp. 644-646, May 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.5
, pp. 644-646
-
-
Mativenga, M.1
Choi, M.H.2
Kang, D.H.3
Jang, J.4
-
5
-
-
70450211244
-
Self-aligned top-gate coplanar In-Ga-Zn-O thin-film transistors
-
Dec.
-
C. H.Wu, H. H. Hsieh, C.W. Chien, and C. C.Wu, "Self-aligned top-gate coplanar In-Ga-Zn-O thin-film transistors," J. Disp. Tech., vol. 5, no. 12, pp. 515-519, Dec. 2009.
-
(2009)
J. Disp. Tech.
, vol.5
, Issue.12
, pp. 515-519
-
-
Wu, C.H.1
Hsieh, H.H.2
Chien, C.W.3
Wu, C.C.4
-
6
-
-
71649115815
-
Amorphous In-Ga-Zn-O thin film transistor with coplanar homojunction structure
-
Dec.
-
A. Sato, M. Shimade, K. Abe, R. Hayashi, H. Kumomi, K. Nomura, T. Kamiya, M. Hirano, and H. Hosono, "Amorphous In-Ga-Zn-O thin film transistor with coplanar homojunction structure," Thin Solid films, vol. 518, no. 4, pp. 1309-1313, Dec. 2009.
-
(2009)
Thin Solid Films
, vol.518
, Issue.4
, pp. 1309-1313
-
-
Sato, A.1
Shimade, M.2
Abe, K.3
Hayashi, R.4
Kumomi, H.5
Nomura, K.6
Kamiya, T.7
Hirano, M.8
Hosono, H.9
-
7
-
-
77950071142
-
Fast all-transparent integrated circuits based on indium gallium zinc oxide thin-film transistors
-
Apr
-
A. Suresh, P.Wellenius, V. Baliga, H. Luo, L. M. Lunardi, and J. F. Muth, "Fast all-transparent integrated circuits based on indium gallium zinc oxide thin-film transistors," IEEE Electron Device Lett., vol. 31, no. 4, pp. 317-319, Apr. 2010.
-
(2010)
IEEE Electron Device Lett.
, vol.31
, Issue.4
, pp. 317-319
-
-
Suresh, A.1
Wellenius, P.2
Baliga, V.3
Luo, H.4
Lunardi, L.M.5
Muth, J.F.6
-
8
-
-
67349285093
-
Source/drain formation of self-aligned top-gate amorphous GaInZnO thin-film transistors by NH3 plasma treatment
-
Apr.
-
W. Kim, J. C. Park, C. J. Kim, I. H. Song, S. I. Kim, S. H. Park, H. Yin, H. I. Lee, E. H. Lee, and Y. S. Park, "Source/drain formation of self-aligned top-gate amorphous GaInZnO thin-film transistors by NH3 plasma treatment," IEEE Electron Device Lett., vol. 30, no. 4, pp. 374-376, Apr. 2009.
-
(2009)
IEEE Electron Device Lett.
, vol.30
, Issue.4
, pp. 374-376
-
-
Kim, W.1
Park, J.C.2
Kim, C.J.3
Song, I.H.4
Kim, S.I.5
Park, S.H.6
Yin, H.7
Lee, H.I.8
Lee, E.H.9
Park, Y.S.10
-
9
-
-
68349109731
-
Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors
-
Oct.
-
A. Valletta, M. Rapisarda, L. Mariucci, A. Pecora, G. Fortunato, C. Caligiore, E. Fontana, F. Tramontana, and S. Leonardi, "Effective channel length and parasitic resistance determination in non self-aligned low temperature polycrystalline silicon thin film transistors," Thin Solid Films, vol. 517, no. 23, pp. 6353-6357, Oct. 2009.
-
(2009)
Thin Solid Films
, vol.517
, Issue.23
, pp. 6353-6357
-
-
Valletta, A.1
Rapisarda, M.2
Mariucci, L.3
Pecora, A.4
Fortunato, G.5
Caligiore, C.6
Fontana, E.7
Tramontana, F.8
Leonardi, S.9
-
10
-
-
54149088432
-
Study on parasitic and channel resistance of poly-silicon thin-film transistors by metal-induced crystallization
-
Jul.
-
S. Saxena, J. H. Cheon, G. P. Kennedyy, J. H. Bae, and J. Jang, "Study on parasitic and channel resistance of poly-silicon thin-film transistors by metal-induced crystallization," J. Soc. Info. Display, vol. 16, no. 7, pp. 721-725, Jul. 2008.
-
(2008)
J. Soc. Info. Display
, vol.16
, Issue.7
, pp. 721-725
-
-
Saxena, S.1
Cheon, J.H.2
Kennedyy, G.P.3
Bae, J.H.4
Jang, J.5
-
11
-
-
48649088281
-
Source/drain series-resistance effects in amorphous gallium-indium zinc-oxide thin film transistors
-
Aug.
-
J. C. Park, C. J. Kim, S. I. Kim, I. H. Song, S. W. Kim, D. H. Kang, H. Lim, H. Yin, R. J. Jung, E. H. Lee, J. C. Lee, K. W. Kwon, and Y. S. Park, "Source/drain series-resistance effects in amorphous gallium-indium zinc-oxide thin film transistors," IEEE Electron Device Lett., vol. 29, no. 8, pp. 879-881, Aug. 2008.
-
(2008)
IEEE Electron Device Lett.
, vol.29
, Issue.8
, pp. 879-881
-
-
Park, J.C.1
Kim, C.J.2
Kim, S.I.3
Song, I.H.4
Kim, S.W.5
Kang, D.H.6
Lim, H.7
Yin, H.8
Jung, R.J.9
Lee, E.H.10
Lee, J.C.11
Kwon, K.W.12
Park, Y.S.13
-
12
-
-
77952471891
-
A novel amorphous InGaZnO thin film transistor structure without source/drain layer deposition
-
Mar.
-
B. D. Ahn, H. S. Shin, G. H. Kim, J. S. Park, and H. J. Kim, "A novel amorphous InGaZnO thin film transistor structure without source/drain layer deposition," Jpn. J. Appl. Phys., vol. 48, no. 3, pp. 03B019-1-03B019-4, Mar. 2009.
-
(2009)
Jpn. J. Appl. Phys.
, vol.48
, Issue.3
-
-
Ahn, B.D.1
Shin, H.S.2
Kim, G.H.3
Park, J.S.4
Kim, H.J.5
-
13
-
-
79957603203
-
High performance amorphous indium-gallium-zinc-oxide thin-film transistor with self-aligned etchstopper patterned by backside UV exposure
-
Jun
-
D. Geng, D. H. Kang, and J. Jang, "High performance amorphous indium-gallium-zinc-oxide thin-film transistor with self-aligned etchstopper patterned by backside UV exposure," IEEE Electron Device Lett., vol. 32, no. 6, pp. 758-760, Jun. 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.6
, pp. 758-760
-
-
Geng, D.1
Kang, D.H.2
Jang, J.3
-
14
-
-
33744527475
-
Dynamic characteristics of MICC polycrystalline thin film transistors
-
DOI 10.1016/j.jnoncrysol.2005.11.131, PII S0022309306003498
-
Y. D. Son, K. D. Yang, B. S. Bae, K. C. Park, and J. Jang, "Dynamic characteristics of MICC polycrystalline thin film transistors," J. Non-Crys. Solids, vol. 352, no. 9-20, pp. 1745-1748, Jun. 2006. (Pubitemid 43816545)
-
(2006)
Journal of Non-Crystalline Solids
, vol.352
, Issue.SPEC. ISS.
, pp. 1745-1748
-
-
Son, Y.-D.1
Yang, K.-D.2
Bae, B.-S.3
Park, K.-C.4
Jang, J.5
|