Dynamic characteristics of MICC polycrystalline thin film transistors

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1745-1748

  Son, Yong Duck ^a   Yang, Kyung Dong ^a   Bae, Byung Seong ^a   Park, Kyu Chang ^a   Jang, Jin ^a  

^a Kyung Hee University   (South Korea)

Author keywords

Crystallization; Thin film transistors

Indexed keywords

ANNEALING; CRYSTALLIZATION; EXCIMER LASERS; OSCILLATORS (ELECTRONIC); POLYCRYSTALLINE MATERIALS; THRESHOLD VOLTAGE;

FIELD-EFFECT MOBILITY; METAL-INDUCED CRYSTALLIZATION; PMOS RING OSCILLATORS;

THIN FILM TRANSISTORS;

EID: 33744527475     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.11.131     Document Type: Article

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