Atomic-scale nanoindentation: Detection and identification of single glide events in three dimensions by force microscopy

Nanotechnology

Volumn 22, Issue 42, 2011, Pages

  Egberts, P ^a,b   Bennewitz, R ^b  

^a MCGILL UNIVERSITY   (Canada)

^b INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; ATOMISTIC SIMULATIONS; DISCRETE SURFACES; FORCE MICROSCOPY; INDENTATION EXPERIMENT; LATERAL DIRECTIONS; LENGTH SCALE; LOAD DEPENDENCE; NANOMETRES; NORMAL DISPLACEMENT; SLIP SYSTEM; SURFACE DISPLACEMENT; THREE DIMENSIONS; TIP DISPLACEMENT;

ATOMIC FORCE MICROSCOPY; EXPERIMENTS; SURFACE MEASUREMENT;

NANOINDENTATION;

EID: 80053256793     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/42/425703     Document Type: Article

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