A kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Egberts, P ^a,b   Filleter, T ^a   Bennewitz, R ^a,b  

^a MCGILL UNIVERSITY   (Canada)

^b INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-RESOLUTION IMAGING; CATION VACANCIES; COATED TIPS; DIVALENT IMPURITIES; EDGE DISLOCATION; INDENTER; INDUCED DISLOCATION; KELVIN PROBE FORCE MICROSCOPY; NEGATIVE CHARGE; POSITIVE CHARGES; SCREW DISLOCATIONS; SURFACE STEPS; TOPOGRAPHIC FEATURES;

ATOMIC FORCE MICROSCOPY; ATOMS; CONDUCTING POLYMERS; CRYSTAL IMPURITIES; DISLOCATIONS (CRYSTALS); PROBES; VICKERS HARDNESS TESTING;

SINGLE CRYSTALS;

CATION; POTASSIUM BROMIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CRYSTAL; ELECTRICITY; ELECTRON MICROSCOPY; IMAGE QUALITY; KELVIN PROBE FORCE MICROSCOPY; PLASTICITY; PRIORITY JOURNAL; RADIUS; VACUUM;

EID: 67649360061     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264005     Document Type: Article

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