SCOPUS 정보 검색 플랫폼

Volumn 99, Issue 11, 2011, Pages

Effect of the induced electron traps by oxygen plasma treatment on transfer characteristics of organic thin film transistors

(2) Huang, Bo Chieh a Lin, Yow Jon a

a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL STABILITY; ELECTRON TRAPPING; GATE-SOURCE VOLTAGE; GRAIN BOUNDARY REGIONS; ORGANIC THIN FILM TRANSISTORS; OXYGEN PLASMA TREATMENTS; TRANSFER CHARACTERISTICS;

ELECTRON TRAPS; ELECTRONS; OXYGEN; PASSIVATION; PLASMA APPLICATIONS; THIN FILMS;

THIN FILM TRANSISTORS;

EID: 80053216023 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3636411 Document Type: Article

Times cited : (36)

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