SCOPUS 정보 검색 플랫폼

Synthetic Metals

Volumn 160, Issue 23-24, 2010, Pages 2628-2630

Leakage conduction mechanism of top-contact organic thin film transistors

(1) Lin, Yow Jon a

a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION (Taiwan)

Author keywords

Leakage conduction; Organic semiconductor; Organic thin film transistors; Schottky emission

Indexed keywords

APPLIED VOLTAGES; DEVICE OPERATIONS; DEVICE PERFORMANCE; GATE-LEAKAGE CURRENT; GATE-LEAKAGE EFFECTS; LEAKAGE CONDUCTION; LEAKAGE CONDUCTION MECHANISM; ORGANIC SEMICONDUCTOR; ORGANIC THIN FILM TRANSISTORS; SCHOTTKY EMISSIONS; TOP-CONTACT DEVICES;

LEAKAGE CURRENTS; THIN FILMS;

THIN FILM TRANSISTORS;

EID: 78650586600 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/j.synthmet.2010.10.015 Document Type: Article

Times cited : (16)

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