Characteristics of a sensitive micro-Hall probe fabricated on chemical vapor deposited graphene over the temperature range from liquid-helium to room temperature

Applied Physics Letters

Volumn 99, Issue 11, 2011, Pages

  Tang, Chiu Chun ^a   Li, Ming Yang ^a   Li, L J ^b   Chi, C C ^a   Chen, J C ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITED; EXTRINSIC DEFECTS; FIELD RESOLUTION; FIELD SENSITIVITY; FUNDAMENTAL LIMITATIONS; HALL PROBE; HALL SENSOR; HIGH FIELD; NOISE PROPERTIES; ROOM TEMPERATURE; SCANNING HALL PROBES; SUBMICRON SPATIAL RESOLUTION; TEMPERATURE RANGE;

GRAPHENE; HALL EFFECT TRANSDUCERS; HELIUM; PROBES; SCANNING; VAPORS;

CHEMICAL VAPOR DEPOSITION;

EID: 80053209632     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3640218     Document Type: Article

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