Quantum point contact microscopy

Nano Letters

Volumn 11, Issue 9, 2011, Pages 3838-3843

  Zhang, Yong Hui ^a,b   Wahl, Peter ^a   Kern, Klaus ^a,c  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b TSINGHUA UNIVERSITY   (China)

^c EPFL   (Switzerland)

Author keywords

atomic resolution; chemical sensitivity; quantum transport; Scanning tunneling microscopy

Indexed keywords

ATOMIC RESOLUTION; CHEMICAL ENVIRONMENT; CHEMICAL SENSITIVITY; LOCAL VARIATIONS; METAL ATOMS; QUANTUM POINT CONTACT; QUANTUM TRANSPORT; REAL-SPACE; SCANNING TUNNELING MICROSCOPES; SURFACE ALLOYS; SURFACE CHARACTERIZATION; TRANSPORT CURRENTS;

ATOMS; PLATINUM; PLATINUM ALLOYS; POINT CONTACTS; QUANTUM ELECTRONICS; SCANNING TUNNELING MICROSCOPY; SENSITIVITY ANALYSIS;

QUANTUM CHEMISTRY;

COPPER; GOLD; METAL; METAL NANOPARTICLE;

ARTICLE; CHEMISTRY; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; THERMODYNAMICS;

COPPER; GOLD; METAL NANOPARTICLES; METALS; MICROSCOPY; MICROSCOPY, SCANNING TUNNELING; NANOTECHNOLOGY; QUANTUM THEORY; SURFACE PROPERTIES; THERMODYNAMICS;

EID: 80052799589     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl201912u     Document Type: Article

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