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Volumn , Issue , 2011, Pages 262-263
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A 0.5V 1.1MS/sec 6.3fJ/conversion-step SAR-ADC with tri-level comparator in 40nm CMOS
a
KEIO UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERTERS;
CALIBRATION PROCEDURE;
CAPACITOR ARRAYS;
CAPACITOR MISMATCH;
CMOS PROCESSS;
DIGITAL-TO-ANALOG CONVERTERS;
LOW VOLTAGE OPERATION;
POWER EFFICIENT;
POWER SUPPLY;
RE-CONFIGURABLE;
SPEED REQUIREMENT;
SUCCESSIVE APPROXIMATION REGISTER;
UNIT CAPACITANCE;
CAPACITORS;
CMOS INTEGRATED CIRCUITS;
COMPARATORS (OPTICAL);
DIGITAL INTEGRATED CIRCUITS;
VLSI CIRCUITS;
ANALOG TO DIGITAL CONVERSION;
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EID: 80052678511
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (41)
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References (5)
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