Vision-based force sensing for nanomanipulation

IEEE/ASME Transactions on Mechatronics

Volumn 16, Issue 6, 2011, Pages 1177-1183

  Chawda, Vinay ^a   O'Malley, Marcia K ^a  

^a Rice University   (United States)

Author keywords

Force measurement; image edge analysis; microscopy

Indexed keywords

AFM; AFM CANTILEVERS; CANTILEVER TIP; CONTINUOUS OPERATION; FAST SCANNING RATE; FORCE FEEDBACK; FORCE SENSOR; IMAGE EDGE ANALYSIS; IMPROVING PERFORMANCE; INTERACTION FORCES; MACRO SCALE; NANO MANIPULATOR; NANO SCALE; NANOMANIPULATIONS; NOISE LEVELS; PRIOR KNOWLEDGE; REAL TIME; SCALED MODELS; SCANNING ELECTRON MICROSCOPES; VISION BASED; VISION BASED ALGORITHMS; VISION-BASED FORCE SENSING;

ALGORITHMS; ESTIMATION; MICROMANIPULATORS; NANOCANTILEVERS; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SENSORS;

ATOMIC FORCE MICROSCOPY;

EID: 80052632437     PISSN: 10834435     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMECH.2010.2093535     Document Type: Article

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