Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 480-486

  Hudson, D ^a   Smith, G D W ^a   Gault, B ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

3D atom probe; Automated ranging; Background correction; Zirconium alloy; ZIRLO

Indexed keywords

AUTOMATION; CORROSION; INTERFACES (MATERIALS); MASS SPECTROMETERS; MASS SPECTROMETRY; MICROANALYSIS; PROBES; TERNARY ALLOYS; ZIRCONIUM ALLOYS;

3D ATOM PROBES; ATOM PROBE TOMOGRAPHY; BACKGROUND CORRECTION; CORROSION PROPERTY; IRON CONCENTRATIONS; OXIDE-METAL INTERFACE; TIME OF FLIGHT MASS SPECTROMETRY; ZIRLO;

ATOMS;

IRON; OXYGEN; ZIRCONIUM DERIVATIVE;

ARTICLE; ATOM PROBE TOMOGRAPHY; AUTOMATION; CONCENTRATION (PARAMETERS); CONTROLLED STUDY; CORROSION; DATA ANALYSIS; MICROANALYSIS; SIMULATION; TOMOGRAPHY;

EID: 80052534054     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.007     Document Type: Article

References (41)

1. E.W. Muller, J.A. Panitz, S.B. McLane, Review of Scientific Instruments 39 (1968) 83-86.
2. A. Cerezo, T.J. Godfrey, G.D.W. Smith, Review of Scientific Instruments 59 (1988) 862-866.
3. D. Blavette, A. Bostel, J.M. Sarrau, B. Deconihout, A. Menand, Nature 363 (1993) 432-435.
4. B. Deconihout, F. Vurpillot, B. Gault, G. Da Costa, M. Bouet, A. Bostel, D. Blavette, A. Hideur, G. Martel, M. Brunel, Surface and Interface Analysis 39 (2007) 278-282.
5. A. Cerezo, P.H. Clifton, S. Lozano-Perez, P. Panayi, G. Sha, G.D.W. Smith, Microscopy and Microanalysis 13 (2007) 408-417.
6. J.H. Bunton, J.D. Olson, D.R. Lenz, T.F. Kelly, Microscopy and Microanalysis 13 (2007) 418-427.
7. T.F. Kelly, D.J. Larson, Materials Characterization 44 (2000) 59-85.
8. R. Schlesiger, C. Oberdorfer, R. Wurz, G. Greiwe, P. Stender, M. Artmeier, P. Pelka, F. Spaleck, G. Schmitz, Review of Scientific Instruments 81 (2010) 043703.
9. P.H. Clifton, T.T. Gribb, S.S.A. Gerstl, R.M. Ulfig, D.J. Larson, Microscopy and Microanalysis 14 (Suppl. 2) (2008) 454-455.
10. P. Panayi, A reflectron for use in a three-dimensional atom probe, International Patent Application WO2006/120428, published November 16, 2006.
11. O. Jagutzki, A. Cerezo, A. Czasch, R. Dorner, M. Hattass, M. Huang, V. Mergel, U. Spillmann, K. Ullmann-Pfleger, T. Weber, H. Schmidt-Bocking, G.D.W. Smith, IEEE Transactions on Nuclear Science 49 (2002) 2477-2483.
12. G. Da Costa, F. Vurpillot, A. Bostel, M. Bouet, B. Deconihout, Review of Scientific Instruments 76 (2005).
13. D.J. Larson, M.K. Miller, R.M. Ulfig, R.J. Matyi, P.P. Camus, T.F. Kelly, Ultramicroscopy 73 (1998) 273-278.
14. M.K. Miller, K.F. Russell, G.B. Thompson, Ultramicroscopy 102 (2005) 287.
15. K. Thompson, D. Lawrence, D.J. Larson, J.D. Olson, T.F. Kelly, B. Gorman, Ultramicroscopy 107 (2007) 131-139.
16. D.N. Seidman, Annual Review of Materials Research 37 (2007) 127-158.
17. T.F. Kelly, D.J. Larson, K. Thompson, R.L. Alvis, J.H. Bunton, J.D. Olson, B.P. Gorman, Annual Review of Materials Research 37 (2007) 681-727.
18. B.P. Geiser, D.J. Larson,E. Oltman, S.S. Gerstl, D.A. Reinhard,T.F. Kelly,T.J. Prosa, Microscopy and Microanalysis 15 (Suppl. 2) (2009) 292-293.
19. B. Gault, D. Haley, F. de Geuser, D.J. Larson, E.A. Marquis, B.P. Geiser, Ultramicroscopy, this issue, doi:10.1016/j.ultramic.2010.11.016.
20. P. Bas, A. Bostel, B. Deconihout, D. Blavette, Applied Surface Science 87-88 (1995)298-304.
21. H.-O. Andrén, Micron 32 (2001) 713-719.
22. R. Ulfig, T. Kelly, B. Gault, Microscopy and Microanalysis 15 (2009) 260-261.
23. E. Oltman, R. Ulfig, D. Larson, Microscopy and Microanalysis 15 (2009) 256-257.
24. A. Bostel, Deconvolution of Mass Spectra, Internal Communication, University of Rouen, 2006.
25. M. Morhac, J. Kliman, V. Matousek, M. Veselsky, I. Turzo, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment 401 (1997) 113-132.
26. D. Hudson, A. Cerezo, G.D.W. Smith, Ultramicroscopy 109 (2009) 667-671.
27. E.A. Marquis, J.M. Hyde, D.W. Saxey, S. Lozano-Perez, V. de Castro, D. Hudson, C.A. Williams, S. Humphry-Baker, G.D.W. Smith, Materials Today 12 (2009) 30-37.
28. F. Vurpillot, B. Gault, A. Vella, M. Bouet, B. Deconihout, Applied Physics Letters 88 (2006) 094105.
29. P. Foster, S.A. Worcester, R.J. Comstock, ZIRLO Material Composition and Fabrication Processing, Westinghouse Electric Corporation, European Patent Office EP19910114158, 1991.
30. M. Preuss, P. Frankel, S. Lozano-Perez, D. Hudson, E. Polatidis, N. Ni, J. Wei, C. English, S. Storer, K.B. Chong, M. Fitzpatrick, F. Wang, J. Smith, C. Grovenor, G.D.W. Smith, J. Sykes, A. Cerezo, B. Cottis, S. Lyon, L Hallstadius, B. Comstock, A. Ambard, M. Blat-Yrieix, Towards a mechanistic understanding of corrosion mechanisms in zirconium alloys, in: 16th International Symposium on Zirconium in the Nuclear Industry, ASTM, Chengdu, China, submitted for publication.
31. D. Hudson, G.D.W. Smith, Scripta Materialia 61 (2009) 411-414.
32. B. Wadman, H.-O. Andren, L.K.L Falk, Journal de Physique 50 (1989) C8-303.
33. M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith, Atom Probe Field Ion Microscopy, Clarendon Press, Oxford, 1996.
34. S.Abolhassani, G.Bart, A. Jakob, Journal of Nuclear Materials 399 (2010) 1-12.
35. N. Nieva, D. Arias, Journal of Nuclear Materials 359 (2006) 29-40.
36. H.-O. Andren, L Mattsson, U. Rolander, Journal de Physique C2 (1986) 191-196.
37. B. Wadman, H.-O. Andren, U. Rolander, Journal de Physique 49-C6 (1988) 323.
38. M.M. Stupel, M. Bamberger, B.Z. Weiss, Scripta Metallurgica 19 (1985) 739-740.
39. P. Merle, K. Loucif, L Adami, R. Borrelly, Journal of Nuclear Materials 208 (1994) 135-143.
40. W.F. Gale, T.C. Totemeier (Eds.), Smithells Metals Reference Book, 8th Edn., Elsevier Butterworth Heinemann, Oxford, 2004.
41. R. Tendler, J.P. Abriata, Journal of Nuclear Materials 150 (1987) 251-258.