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Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 589-594

Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser

(5) Li, F a,c Ohkubo, T a,c Chen, Y M b Kodzuka, M b Hono, K a,b,c

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b UNIVERSITY OF TSUKUBA (Japan)

c JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

Femtosecond laser; Laser assisted atom probe; Rare earth doped ceria

Indexed keywords

ATOMS; GRAIN BOUNDARIES; LASER PULSES; MASS SPECTROMETRY; PROBES; PULSED LASERS; RARE EARTHS; ULTRAFAST LASERS; ULTRASHORT PULSES; YTTRIUM; YTTRIUM ALLOYS;

ATOM PROBE; ATOM PROBE ANALYSIS; EVAPORATION CONDITIONS; FEMTOSECOND PULSED LASER; IRRADIATION CONDITIONS; PULSE FREQUENCIES; RARE EARTH DOPED CERIA; SPECIMEN TEMPERATURE;

ATOM LASERS;

CERIUM OXIDE; LANTHANIDE; YTTRIUM;

ANALYTIC METHOD; ARTICLE; ATOM PROBE ANALYSIS; FEMTOSECOND LASER; IRRADIATION; MASS SPECTROMETRY; PULSE RATE; QUANTITATIVE ANALYSIS;

EID: 80052534047 PISSN: 03043991 EISSN: 18792723 Source Type: Journal
DOI: 10.1016/j.ultramic.2010.12.011 Document Type: Article

Times cited : (25)

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