Analysis of bulk dielectrics with atom probe tomography

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1254-1255

  Larson, D J ^a   Alvis, R L ^a   Lawrence, D F ^a   Prosa, T J ^a   Ulfig, R M ^a   Reinhard, D A ^a   Clifton, P H ^a   Gerstl, S S A ^a   Bunton, J H ^a   Lenz, D R ^a   Kelly, T F ^a   Stiller, K ^b  

^a Imago Scientific Instruments   (United States)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549093611     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608083657     Document Type: Conference Paper

References (7)

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5. B. Gault et al., Appl. Phys. Lett. 88 (2006) 114101.
6. C. Oberdorfer et al., Micro. Microanal. 123 (2007) 342.
7. J. Angenete, K. Stiller and V. Langer, Oxidation of Metals 60 (2003) 47.