A photothermal microscopy investigation of carrier transport in ion implanted silicon thin films under the action of external electric field

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 5, Issue 5, 2011, Pages 505-509

  Nestoros, M ^a   Mourouti, M ^b   Papanicolaou, N C ^a   Christofides, C ^b  

^a UNIVERSITY OF NICOSIA   (Cyprus)

^b UNIVERSITY OF CYPRUS   (Cyprus)

Author keywords

Carrier transport; Implanted silicon thin films; Photothermal microscopy

Indexed keywords

CARRIER TRANSPORT; ELECTRIC FIELDS; MICROELECTRONICS; SILICON;

EXTERNAL ELECTRIC FIELD; ION-IMPLANTED SILICON; MICROELECTRONIC CIRCUITS; ONE-DIMENSIONAL MODEL; PHOTOTHERMAL MICROSCOPY; PHOTOTHERMAL SIGNALS; SENSITIVE TECHNIQUES; SILICON THIN FILM;

THIN FILMS;

EID: 80052519356     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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