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Applied Physics Letters

Volumn 99, Issue 5, 2011, Pages

Downscaling effects on self-heating related instabilities in p-channel polycrystalline silicon thin film transistors

(6) Valletta, A a Gaucci, P a Mariucci, L a Pecora, A a Maiolo, L a Fortunato, G a

a CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL TEMPERATURE; DEVICE SPEED; DOWN-SCALING; POLYCRYSTALLINE SILICON THIN-FILM TRANSISTOR; POWER DENSITIES; SCALED DEVICES; SELF-HEATING; THERMAL DISSIPATION;

HEATING; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; THIN FILM DEVICES; THIN FILMS; TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 80051582557 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3621874 Document Type: Article

Times cited : (6)

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