Hot-carrier effects in p -channel polycrystalline silicon thin film transistors

Applied Physics Letters

Volumn 89, Issue 18, 2006, Pages

  Mariucci, L ^a   Valletta, A ^a   Gaucci, P ^a   Fortunato, G ^a   Templier, F ^b  

^a IFN CNR   (Italy)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON TRAPS; HOT CARRIERS; POLYCRYSTALLINE MATERIALS; SILICON;

BACK INTERFACES; BIAS STRESS; CHARGE INJECTION MODEL; KINK EFFECT;

THIN FILM TRANSISTORS;

EID: 33750686633     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2378587     Document Type: Article

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