Two-dimensional electron transport in MgZnO/ZnO heterostructures: Role of interface roughness

Journal of Physics D: Applied Physics

Volumn 44, Issue 32, 2011, Pages

  Thongnum, A ^a   Sa Yakanit, V ^b   Pinsook, U ^b,c  

^a SRINAKHARINWIROT UNIVERSITY   (Thailand)

^b CHULALONGKORN UNIVERSITY   (Thailand)

^c Thailand Ministry of Science and Technology   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT; FITTING PARAMETERS; IN-PLANE DIRECTION; INTERFACE ROUGHNESS; PATH-INTEGRAL; POSITIVE CHARGES; SCATTERING POTENTIALS;

CRYSTALS; ELECTRIC CHARGE; ELECTROMAGNETIC INDUCTION; ELECTRON GAS; ELECTRON MOBILITY; HETEROJUNCTIONS; INTERFACES (MATERIALS); POLARIZATION; TWO DIMENSIONAL;

ELECTRONS;

EID: 80051484072     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/32/325109     Document Type: Article

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