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Volumn 82, Issue 7, 2011, Pages

An in-vacuum diffractometer for resonant elastic soft x-ray scattering

(16) Hawthorn, D G a He, F b Venema, L c Davis, H d Achkar, A J a Zhang, J a Sutarto, R d Wadati, H d,e Radi, A d Wilson, T b Wright, G b Shen, K M f Geck, J g Zhang, H h Novak V i Sawatzky, G A d

a UNIVERSITY OF WATERLOO (Canada)

b CANADIAN LIGHT SOURCE INC (Canada)

c UNIVERSITY OF GRONINGEN (Netherlands)

d UNIVERSITY OF BRITISH COLUMBIA (Canada)

e UNIVERSITY OF TOKYO (Japan)

f Laboratory of Atomic and Solid State Physics and Cornell Center for Materials Research (United States)

g IFW DRESDEN (Germany)

h UNIVERSITY OF TORONTO (Canada)

i INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

BASE PRESSURE; BASE TEMPERATURE; BEAM LINES; CHANNEL-PLATE DETECTORS; CHANNELTRON; CLOSED CYCLE; DIFFRACTION SIGNALS; IN-VACUUM; INELASTIC X RAY SCATTERING; ND-DOPED; PHOTON DETECTOR; SOFT X-RAY; STEPPER MOTOR;

DETECTORS; DIFFRACTION; DIFFRACTOMETERS; GALLIUM; LIGHT SOURCES; MANGANESE; PHOTONS; VACUUM; X RAY SCATTERING; X RAYS;

SCATTERING;

EID: 79961156561 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3607438 Document Type: Article

Times cited : (60)

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