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Review of Scientific Instruments

Volumn 79, Issue 8, 2008, Pages

An advanced magnetic reflectometer

(5) Brück, Sebastian a Bauknecht, Steffen a Ludescher, Bernd a Goering, Eberhard a Schütz, Gisela a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; DICHROISM; ELECTROMAGNETIC WAVES; MAGNETIC FIELDS; MAGNETIC MATERIALS; OPTICAL PROPERTIES; REFLECTION; REFLECTOMETERS;

CHEMICAL-; MAGNETIC ABSORPTION; REFLECTOMETRY; X-RAY MAGNETIC CIRCULAR DICHROISM; X-RAY REFLECTOMETRY;

ABSORPTION SPECTROSCOPY;

EID: 50849110482 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2970941 Document Type: Article

Times cited : (23)

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