Diffractometer for soft x-ray resonant magnetic scattering

Review of Scientific Instruments

Volumn 74, Issue 9, 2003, Pages 4048-4051

  Grabis, J ^a   Nefedov, A ^a   Zabel, H ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; ELECTROMAGNETIC WAVE ABSORPTION; MAGNETIC FIELDS; MAGNETIC RESONANCE; MULTILAYERS; TRANSITION METALS; X RAY SCATTERING;

X-RAY RESONANT MAGNETIC SCATTERING (XRMS);

MAGNETIC FILMS;

EID: 0142102662     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1602932     Document Type: Review

References (18)

1. H. Zabel and K. Theis-Bröhl, J. Phys.: Condens. Matter 15, S505 (2003).
2. J. P. Hannon, G. T. Trammel, M. Blume, and D. Gibbs, Phys. Rev. Lett. 61, 1245 (1988).
3. D. Gibbs, D. R. Harshman, E. D. Isaacs, D. B. McWhan, D. Mills, and C. Vettier, Phys. Rev. Lett. 61, 1241 (1988).
4. A. Decheletteand et al., Phys. Rev. B 60, 6636 (1999).
5. L. Seve et al., Phys. Rev. B 60, 9662 (1999).
6. J. Geissler, E. Goering, M. Justen, F. Weigand, G. Schütz, J. Langer, D. Schmitz, H. Maletta, and R. Mattheis, Phys. Rev. B 65, 020405(R) (2002).
7. J. W. Freeland, V. Chakarian, K. Bussmann, Y. U. Idzerda, H. Wende, and C. C. Kao, J. Appl. Phys. 83, 6290 (1998).
8. W. Jark and J. Stöhr, Nucl. Instrum. Methods Phys. Res. A 266, 654 (1988).
9. M. D. Roper, G. van der Laan, H. A. Dürr, E. Dudzik, S. P. Collins, M. C. Miller, and S. P. Thompson, Nucl. Instrum. Methods Phys. Res. A 467-468, 1101 (2001).
10. F. Schäfers et al., Appl. Opt. 38, 4074 (1999).
11. We have recently learned that another diffractometer with an extended range of parameters has been built at the National Synchrotron Light Source, Brookhaven National Laboratory, and is cited in P. Abbamonte, L. Venema, A. Rusydi, G. A. Sawatzky, G. Logvenov, and I. Bozovic, Science 297, 581 (2002).
12. H.-C. Mertins, D. Abramsohn, A. Gaupp, F. Schäfers, and W. Gudat, Phys. Rev. B 66, 184404 (2002).
13. http://www.certif.com. Certified Scientific Software, Cambridge, MA 02439.
14. T. P. A. Hase, I. Pape, B. K. Tanner, H. Dürr, E. Dudzik, G. van der Laan, C. H. Marrows, and B. J. Hickey, Phys. Rev. B 61, R3792 (2000).
15. T. P. A. Hase, I. Pape, D. E. Read, B. K. Tanner, H. Dürr, E. Dudzik, G. van der Laan, C. H. Marrows, and B. J. Hickey, Phys. Rev. B 61, 15331 (2000).
16. U. Geiersbach, A. Bergmann, and K. Westerholt, J. Magn. Magn. Mater. 240, 546 (2002).
17. U. Geiersbach, A. Bergmann, and K. Westerholt, Thin Solid Films 425, 226 (2003).
18. K. Westerholt, U. Geiersbach, and A. Bergmann, J. Magn. Magn. Mater. 257, 239 (2003).