An apparatus for temperature-dependent soft X-ray resonant magnetic scattering

Journal of Synchrotron Radiation

Volumn 11, Issue 4, 2004, Pages 353-357

  Jaouen, Nicolas ^a   Tonnerre, Jean Marc ^a   Kapoujian, Grigor ^a   Taunier, Pierre ^a   Roux, Jean Paul ^a   Raoux, Denis ^a   Sirotti, Fausto ^b  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

X ray magnetic scattering

Indexed keywords

DIFFRACTOMETERS; ELECTROMAGNETIC WAVE POLARIZATION; MAGNETIC DOMAINS; MAGNETIC MOMENTS; MAGNETORESISTANCE; RESONANCE; THERMAL EFFECTS; THIN FILMS; ULTRAHIGH VACUUM;

MAGNETIC DIFFRACTION; MAGNETIC STRUCTURES; X-RAY RESONANT MAGNETIC SCATTERING;

X RAY SCATTERING;

EID: 11844249968     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504013767     Document Type: Article

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