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Volumn 110, Issue 2, 2011, Pages

Carrier recombination dynamics in Si doped InN thin films

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LOCALIZATION; CARRIER RECOMBINATION DYNAMICS; DECAY TIME; EMISSION ENERGIES; FLUENCES; FORMATION MECHANISM; FREE-TO-BOUND TRANSITIONS; INN THIN FILMS; INTERVALLEY SCATTERING; LOCALIZATION ENERGY; PL SPECTRA; RADIATIVE LIFETIME; THEORETICAL MODELS; TIME-RESOLVED PHOTOLUMINESCENCE;

EID: 79961106641     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3607271     Document Type: Article
Times cited : (12)

References (24)
  • 1
    • 67650711664 scopus 로고    scopus 로고
    • 10.1063/1.3155798
    • J. Wu, J. Appl. Phys. 106, 011101 (2009). 10.1063/1.3155798
    • (2009) J. Appl. Phys. , vol.106 , pp. 011101
    • Wu, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.