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Volumn 44, Issue 33-36, 2005, Pages

Polycrystalline to single-crystalline InN grown on Si(111) substrates by plasma-assisted molecular-beam epitaxy

Author keywords

Epilayer; Hall measurement; InN; MBE; Nanocolumn; Photoluminescence; Si; XRD

Indexed keywords

CARRIER CONCENTRATION; HALL EFFECT; INFRARED RADIATION; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; PLASMAS; POLYCRYSTALLINE MATERIALS; SILICON; SINGLE CRYSTALS; X RAY DIFFRACTION;

EID: 31044438265     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L1076     Document Type: Article
Times cited : (36)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.